Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « X. Melique »
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X. Marie < X. Melique < X. Portier  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 10.
Ident.Authors (with country if any)Title
000872 (2005) Three-dimensional calculation of propagation losses in photonic crystal waveguides
000A62 (2004) Time dependence of directive channelling in photonic crystal based multiport devices
001370 (2000) Transferred-substrate InP-based heterostructure barrier varactor diodes on quartz
001448 (2000) Fabrication and performance of InP-based heterostructure barrier varactors in a 250-GHz waveguide tripler
001673 (1999) Record performance of a 250 GHz InP-based heterostructure barrier varactor tripler
001972 (1998) Micromachining and mechanical properties of GaInAs/InP microcantilevers
001990 (1998) InGaAs/InAlAs/AlAs heterostructure barrier varactors for harmonic multiplication
001999 (1998) High capacitance ratio with GaAs/InGaAs/AlAs heterostructure quantum well-barrier varactors
001A25 (1998) Capacitance engineering for InP-based heterostructure barrier varactor
001A43 (1998) 5-mw and 5% efficiency 216-GHz InP-based heterostructure barrier varactor tripler

List of associated KwdEn.i

Nombre de
documents
Descripteur
5Heterojunctions
4Indium phosphide
4Varactors
3Binary compound
3Capacitance
3Heterojunction
3Heterostructure barrier varactors
3Varactor diode
2Aluminium Arsenides
2Experimental study
2Experiments
2Finite difference time-domain analysis
2Gallium Arsenides
2III-V compound
2Indium Arsenides
2Integrated optics
2Molecular beam epitaxy
2Optical waveguide
2Photonic crystal
2Semiconducting aluminum compounds
2Semiconducting gallium arsenide
2Semiconducting indium compounds
2Semiconducting indium phosphide
2Semiconductor device manufacture
2Semiconductor quantum wells
2Ternary compound
2Theory
1Barrier tripler
1Barrier varactor triplers
1Bending test
1Cantilever
1Cantilever beam
1Capacitance voltage characteristics
1Carrier concentration
1Chemical etching
1Coplanar line
1Eigenmode
1Eigenvalues and eigenfunctions
1Electric breakdown
1Electrical characteristic
1Electromagnetic wave diffraction
1Electromagnetic wave propagation
1Frequency band
1Frequency multiplier
1Gallium arsenides
1Gas source molecular beam epitaxy Riber (GSMBE) system
1Hardness test
1Harmonic multipliers
1High performance
1Indium Phosphides
1Indium arsenides
1Integrated circuit
1Leakage current
1Lift off
1Manufacturing process
1Mechanical properties
1Microelectronic fabrication
1Micromachining
1Microwave
1Microwave circuit
1Microwave device
1Millimeter waves
1Miniaturization
1Non linear optics
1Optical losses
1Optical multiplexer
1Output power
1Performance evaluation
1Planar technology
1Potential barrier
1Precision engineering
1Probe
1Production process
1Radio frequency
1Radiofrequency
1Semiconductor device
1Semiconductor device structures
1Strained layer
1Theoretical study
1Voltage capacity curve
1Wafer
1Waveguide components
1Waveguide couplers
1Waveguide tripler
1s parameter

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