X. Le Cleac H < X. Letartre < X. Lu

Facettes :

List of bibliographic references

Number of relevant bibliographic references: 31.
[0-20] [0 - 20][0 - 31][20-30][20-40]

Ident.	Authors (with country if any)	Title
000011 (2013)		Towards an Integrated Mode-Locked Microlaser Based on Two-Dimensional Photonic Crystals and Graphene
000366 (2010)		3D harnessing of light with photon cage
000635 (2007)		Photonic crystal slab reflectors for compact passive and active optical devices
000851 (2006)		Compact Photonic devices based on 1D and 2D photonic crystal broadband reflectors
000871 (2005)		Tuning a two-dimensional photonic crystal resonance via optical carrier injection
000A71 (2004)		Surface operation photonic devices based on two dimensional InP membrane photonic crystals
000C11 (2003-11)		3D structuring of multilayer suspended membranes including 2D photonic crystal structures
000C64 (2003-01-01)		Two-dimensional hexagonal-shaped microcavities formed in a two-dimensional photonic crystal on an InP membrane
000C72 (2003)		Very low threshold vertical emitting laser operation in InP graphite photonic crystal slab on silicon
000E13 (2002-12-30)		InP-based two-dimensional photonic crystal on silicon: In-plane Bloch mode laser
000E33 (2002-09-01)		Propagation losses of the fundamental mode in a single line-defect photonic crystal waveguide on an InP membrane
000E79 (2002-02-01)		Near-field probing of active photonic-crystal structures
000E88 (2002)		Microlasers à cristaux photoniques en InP reporté sur silicium
001228 (2001)		InP microdisk lasers on silicon wafer: CW room temperature operation at 1.6μm
001229 (2001)		InP 2D photonic crystal microlasers on silicon wafer: Room temperature operation at 1.55 μm
001274 (2001)		Characterisation of 2D photonic crystals cavities on InP membranes
001294 (2000-12-01)		InAs quantum wires in InP-based microdisks: Mode identification and continuous wave room temperature laser operation
001432 (2000)		InP-based MOEMS and related topics
001583 (1999-04-05)		Piezoelectrically induced electronic confinement obtained by three-dimensional elastic relaxation in III-V semiconducting overhanging beams
001921 (1998)		Temperature dependence of AlInAs band gap energy and AlInAs/InP band offsets
001A87 (1997-09-15)		Mechanical relaxation of strained semiconducting stripes: Influence on optoelectronic properties

---

List of associated KwdEn.i

Nombre de documents	Descripteur
18	Experimental study
11	III-V semiconductors
9	Indium compounds
9	Indium phosphides
8	Binary compounds
8	Photoluminescence
6	Molecular beam epitaxy
5	Optical pumping
5	Semiconductor materials
5	Theoretical study
4	Aluminium arsenides
4	Experiments
4	Gallium arsenides
4	Heterojunctions
4	Micromachining
4	Photonic band gap
4	Photonic crystal
4	Photonic crystals
4	Quantum well lasers
4	Semiconductor quantum wells
4	Two dimensional structure
3	Band offset
3	Band structure
3	Indium Phosphides
3	Indium arsenides
3	Integrated optics
3	Membranes
3	Optical losses
3	Optical materials
3	Optical microcavity
3	Optical waveguides
3	Photonics
3	Semiconducting indium phosphide
3	Silicon wafers
3	Ternary compounds
2	Anelastic relaxation
2	Binary compound
2	Bloch wave
2	Bragg reflection
2	Computerized simulation
2	Deep level transient spectrometry
2	Electron beam lithography
2	Fabry Perot resonator
2	Finite difference time-domain analysis
2	Gallium Arsenides
2	Gallium Indium Arsenides Mixed
2	High electron mobility transistors
2	III-V compound
2	Inorganic compound
2	Laser materials
2	Microlaser
2	Micromechanical devices
2	Multilayers
2	Nanotechnology
2	Normal incidence
2	Ohmic contacts
2	Optoelectronic devices
2	Quantum well
2	Quantum wells
2	Self consistency
2	Semiconducting indium compounds
2	Semiconductor device manufacture
2	Semiconductor lasers
2	Semiconductor quantum wires
2	Signal noise measurement
2	Solid-solid interfaces
2	Stress relaxation
2	Theory
2	Tunable filter
2	Tunnel effect
2	Wavelength division multiplexing
2	photonic crystals
1	Acceptor center
1	Acceptors
1	Ambient temperature
1	Application
1	Bending test
1	Binding energy
1	Buffer layers
1	CW lasers
1	Cavity resonators
1	Charge carrier injection
1	Class E
1	Computer simulation
1	Conduction band
1	Conduction bands
1	Contact resistance
1	Cross section
1	Crystal lattices
1	Current voltage characteristics
1	Deep electron traps
1	Defect states
1	Deformation
1	Digital simulation
1	Dispersion relation
1	Distributed Bragg reflection
1	Drain current fluctuations
1	Electric current measurement
1	Electric currents
1	Electromechanical device

---

Pour manipuler ce document sous Unix (Dilib)

EXPLOR_STEP=IndiumV3/Data/France/Analysis

HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i -k "X. Letartre" 

HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i  \
                -Sk "X. Letartre" \
         | HfdSelect -Kh $EXPLOR_AREA/Data/France/Analysis/biblio.hfd 

Pour mettre un lien sur cette page dans le réseau Wicri

{{Explor lien
   |wiki=   *** parameter Area/wikiCode missing *** 
   |area=    IndiumV3
   |flux=    France
   |étape=   Analysis
   |type=    indexItem
   |index=    Author.i
   |clé=    X. Letartre
}}

---

This area was generated with Dilib version V0.5.77. Data generation: Mon Jun 9 10:27:54 2014. Site generation: Thu Mar 7 16:19:59 2024