Auteurs
Analysis
France
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Analysis
France
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Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « T. Zimmer »
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T. Yamaguchi < T. Zimmer < T.-J. Lu  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 4.
Ident.Authors (with country if any)Title
000179 (2011) Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses
000204 (2011) Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design
000258 (2010) Thermal aging model of InP/InGaAs/InP DHBT
000277 (2010) Preliminary results of storage accelerated aging test on InP/InGaAs DHBT

List of associated KwdEn.i

Nombre de
documents		Descripteur
4Base emitter junction
4Binary compound
4Damaging
4Failures
4Heterojunction bipolar transistors
4Indium phosphide
3Accelerated aging test
3Collector
3Current gain
3Reliability
2Circuit design
2Compact design
2Computer aided design
2Current density
2Electric stress
2Electrical model
2Modeling
2Very high speed integrated circuits
1Activation energy
1Ageing
1Aging test
1Base collector junction
1Direct current
1Doping
1High density
1High strength current
1Ideality
1Implementation
1Planarization
1Test method
1Thermal ageing
1Thermal model
1Thermal stress
1Transmitter

Pour manipuler ce document sous Unix (Dilib)

EXPLOR_STEP=IndiumV3/Data/France/Analysis

HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i -k "T. Zimmer" 

HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i  \
                -Sk "T. Zimmer" \
         | HfdSelect -Kh $EXPLOR_AREA/Data/France/Analysis/biblio.hfd

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   |wiki=   *** parameter Area/wikiCode missing *** 
   |area=    IndiumV3
   |flux=    France
   |étape=   Analysis
   |type=    indexItem
   |index=    Author.i
   |clé=    T. Zimmer
}}
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