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Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « T. Benabbas »
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T. Ben Nasrallah < T. Benabbas < T. Benyattou  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 8.
Ident.Authors (with country if any)Title
000F71 (2002) Moiré-like fringes in transmission electron microscopy images of coherently strained semiconductor islands
001543 (1999-08-15) High resolution electron microscope analysis of lattice distortions and In segregation in highly strained In0.35Ga0.65As coherent islands grown on GaAs (001)
001544 (1999-08-15) A finite-element study of strain fields in vertically aligned InAs islands in GaAs
001635 (1999) Transmission electron microscopy analysis of the shape and size of semiconductor quantum dots
001925 (1998) Surface relaxation of strained semiconductor heterostructures revealed by finite-element calculations and transmission electron microscopy
001C83 (1997) Elastic misfit stress relaxation in In0.25Ga0.75As layers grown under tension on InP(001)
001D58 (1996-09-01) Stress relaxation in highly strained InAs/GaAs structures as studied by finite element analysis and transmission electron microscopy
001F59 (1996) Dislocation introduction in the initial stages of MBE growth of highly strained In0.30Ga0.70As/GaAs structures

List of associated KwdEn.i

Nombre de
documents		Descripteur
7Experimental study
7Gallium arsenides
5Finite element method
5Indium arsenides
5TEM
4Semiconductor materials
3Binary compounds
3III-V semiconductors
3Island structure
3Stress relaxation
3Ternary compounds
2Atomic force microscopy
2Epitaxial layers
2Heterojunctions
2Indium compounds
2Quantum dots
2Strained layer
2Surfaces
2Theoretical study
1Buried layers
1Coalescence
1Crystal growth
1Crystal nucleation
1Dark field microscopy
1Dimensions
1Dislocations
1Displacement field
1Dynamic model
1Elastic deformation
1Fourier analysis
1Geometrical shape
1Image analysis
1Image contrast
1Internal stresses
1Lattice relaxation
1Moire fringes
1Molecular beam epitaxy
1Nucleation
1Roughness
1STM
1Semiconductor epitaxial layers
1Semiconductor quantum dots
1Stresses
1Substrates
1Surface diffusion
1Surface segregation
1Surface structure
1Thickness
1Thin films
1Transmission electron microscopy

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EXPLOR_STEP=IndiumV3/Data/France/Analysis

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HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i  \
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         | HfdSelect -Kh $EXPLOR_AREA/Data/France/Analysis/biblio.hfd

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   |clé=    T. Benabbas
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