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Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « S. Ravelet »
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S. Rapp < S. Ravelet < S. Raymond  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 9.
Ident.Authors (with country if any)Title
000C09 (2003-11-15) Influence of oxygen plasma on electrical and physical parameters of Au-oxide-n-InP structures
001572 (1999-05-15) Physical parameters of Au-n-InP structures
001D52 (1996-10) Contribution à la caractérisation des diodes Schottky Oxydées: Application au phosphure d'indium
002527 (1993) Transport processes in Au/n-InP and Au/oxide/n-InP devices treated in oxygen multipolar plasma
002584 (1993) Photoluminescence characterization of structures obtained by multipolar plasma oxidation of InP
002E15 (1988) Determination by optical DLTS of the distribution of states near the valence band of plasma oxidized n-type InP
002E96 (1987) Preparation and electrical properties of thin native oxide double-layer insulator films on n-type InP
002F39 (1987) Effect of a finite R.F. conductance of native oxide on InP metal/insulator/semiconductor admittance
003014 (1986) Interface properties of MIS structures prepared by plasma oxidation of n-InP

List of associated KwdEn.i

Nombre de
documents		Descripteur
7Indium Phosphides
5Experimental study
5Oxidation
5Voltage current curve
4Interface electron state
4MIS structure
3Gold
3Voltage capacity curve
2Characterization
2Density of states
2Electrical characteristic
2III-V compound
2III-V semiconductors
2Indium compounds
2Oxide layer
2Schottky barrier diode
1Barrier height
1Binary compound
1Capacitor
1Chemical composition
1Deep level transient spectrometry
1Electric contact
1Electrical conductivity
1Electrical insulation
1Ellipsometry
1Fermi level
1Ideality
1Interface
1MIS structures
1MOS capacity
1MOS structure
1Material testing
1Metal semiconductor field effect transistor
1Microelectronic fabrication
1Minority carrier
1Optical properties
1Optoelectronic device
1Passivation
1Permittivity
1Photoelectron emission
1Photoluminescence
1Plasma assisted processing
1Refraction index
1Schottky barriers
1Semiconductor device
1Semiconductor metal contact
1Semiconductor oxide contact
1Semiconductor-metal boundaries
1Series resistance
1Stoichiometry
1Thin film
1Transport process
1Tunnel effect
1Voltage
1X ray

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EXPLOR_STEP=IndiumV3/Data/France/Analysis

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HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i  \
                -Sk "S. Ravelet" \
         | HfdSelect -Kh $EXPLOR_AREA/Data/France/Analysis/biblio.hfd

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