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Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « S. Juillaguet »
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S. Jourba < S. Juillaguet < S. Jullian  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 7.
Ident.Authors (with country if any)Title
002591 (1993) Optical tools for intermixing diagnostic : application to InGaAs/InGaAsP microstructures
002608 (1993) Non-destructive approaches to interdiffusion phenomena across GaInAs/GaInAsP interfaces : photoluminescence vs. Raman
002614 (1993) Morphology of InGaAs/InP QWs : from excitonic spectroscopy to HR-TEM analyses
002639 (1993) Interface characterization of strained InGaAs/InP quantum wells after a growth interruption sequence
002664 (1993) Growth and characterization of In0.53Ga0.47As/InxGa1-xAs strained-layer superlattices
002679 (1993) Evidence for non-uniform interface thickness in strained InGaAs/InP quantum wells
002A33 (1991) Finite interface effects for thin GaInAs/InP quantum wells grown by LP-MOVPE with a growth interruption sequence

List of associated KwdEn.i

Nombre de
documents		Descripteur
5Gallium Indium Arsenides Mixed
4Crystal growth
4Experimental study
3Epitaxy
3Indium Phosphides
3Interdiffusion
3Interface
3Optoelectronic device
3Organometallic compound
3Quantum well
3Semiconductor materials
2Chemical vapor deposition
2Gallium arsenides
2Indium arsenides
2Interface structure
2Optical properties
2Photoluminescence
2Raman spectrometry
2Ternary compounds
1Arsenic Gallium Indium Phosphides Mixed
1Binary compounds
1Diffusion
1Diffusion coefficient
1Diffusion equation
1Epitaxial film
1Excitons
1Gallium Indium Arsenides phosphides Mixed
1Growth from vapor
1Heat treatment
1In situ
1Indium phosphides
1Inorganic compound
1Light dispersion
1Low pressure
1Microelectronics
1Microstructure
1Mismatch lattice
1Multiple quantum well
1Operating mode
1Optical spectrometry
1Optical transition
1Optoelectronic devices
1Quantum wells
1Roughness
1Solid solid interface
1Strained quantum well
1Superlattices
1TEM
1Theoretical study
1Thermal diffusivity
1Thickness
1Thin film
1Thin films
1Transition energy
1Transmission electron microscopy
1Wafer

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   |clé=    S. Juillaguet
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