Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « S. Biblemont »
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S. Besbes < S. Biblemont < S. Bisot-Locard  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 5.
Ident.Authors (with country if any)Title
001A19 (1998) Doping optimizations for InGaAs/InP composite channel HEMTs
001B83 (1997) Uniform InAlAs/InP HFET fabricated using selective dry recess etching
001F10 (1996) Low excess noise of InAlAs/InP HFETs fabricated using selective dry recess etching
002218 (1995) 8 Gbit/s GaAs-on-InP 1.3 μm wavelength OEIC transmitter
002A47 (1991) Electrical and structural characterization of GaAs on InP grown by OMCVD ; application to GaAs MESFETs

List of associated KwdEn.i

Nombre de
documents
Descripteur
3Binary compound
3Gallium Arsenides
3Indium Phosphides
3Scanning electron microscopy
2Circuit design
2Experimental study
2Field effect transistor
2Heterojunction transistor
2Microelectronic fabrication
2Reactive ion etching
2Ternary compound
1Aluminium arsenides
1Annealing
1Bandwidth
1Characterization
1Chemical vapor deposition
1Composite canal
1Crystal growth
1Current gain
1Current-optical power characteristic
1Delta doping
1Drain noise spectral density
1Drain resistance
1Dry etching
1Dry recess etching
1Dynamic characteristic
1Electric resistance
1Electrical characteristic
1Electroabsorption modulator
1Engraving
1Experiments
1Field effect transistors
1Frequency characteristic
1Gates (transistor)
1Hall mobility
1Heterojunction
1High electron mobility transistor
1III-V compound
1Indium Arsenides
1Indium arsenides
1Indium phosphide
1Integrated circuit
1Integrated optoelectronics
1Junction field effect transistor
1Low frequency noise
1MOVPE method
1Manufacturing process
1Metal semiconductor field effect transistor
1Monolithic integrated circuit
1Optical transmission
1Optimization
1Optoelectronic device
1Organometallic compound
1Segregation analysis
1Semiconducting indium compounds
1Semiconducting indium phosphide
1Semiconductor device manufacture
1Signal noise measurement
1Spurious signal noise
1Temperature effect
1Transfer characteristic
1Transistor
1Transmitter
1Voltage current curve

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