Auteurs
Analysis
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Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « R. Plana »
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R. Piron < R. Plana < R. Planel  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 7.
Ident.Authors (with country if any)Title
001236 (2001) Hydrogen-related effects in GaInP/GaAs HBTs: incorporation, removal and influence on device reliability
001425 (2000) Low frequency noise behaviour of InP/InGaAs heterojunction bipolar waveguide phototransistors
001B60 (1997) Propriétés en bruit basse fréquence des DHBT's GaInP/GaAs/GaInP
002032 (1995-08-15) Low frequency noise characterization of self-aligned InP/InGaAs heterojunction bipolar transistors
002121 (1995) Small-signal and noise model extraction technique for heterojunction bipolar transistor at microwave frequencies
002609 (1993) Noise in AlGaAs/InGaAs/GaAs pseudomorphic HEMT's from 10 Hz to 18 GHz
002851 (1992) Low frequency noise in selfaligned GaInP/GaAs heterojunction bipolar transistor

List of associated KwdEn.i

Nombre de
documents		Descripteur
3Gallium Arsenides
21/f noise
2Binary compound
2Bipolar transistor
2Gallium arsenides
2Heterojunction bipolar transistors
2Heterojunction transistor
2Noise
2Ternary compound
1Aluminium Gallium Arsenides Mixed
1Annealing
1Bipolar transistors
1Carbon addition
1Characterization
1Charge carrier recombination
1Current gain
1Degradation
1Doping
1Double heterojunction
1Electric currents
1Electrical characteristic
1Experimental study
1Field effect transistor
1Frequency characteristic
1Frequency response
1Gallium Indium Arsenides Mixed
1Gallium Indium Phosphorus Mixed
1Gallium Phosphides
1Gallium phosphide
1Heterojunction bipolar phototransistors (HPT)
1Heterojunctions
1High electron mobility transistor
1Hydrogenation
1III-V compound
1Indium Phosphides
1Indium arsenides
1Indium phosphide
1Indium phosphides
1Leakage current
1Low frequency noise (LFN)
1Metal semiconductor field effect transistor
1Microwave circuit
1Microwave transistor
1Optical waveguides
1Parameter extraction
1Performance
1Performance evaluation
1Phototransistors
1Reliability
1Secondary ion mass spectrometry
1Semiconducting indium gallium arsenide
1Semiconducting indium phosphide
1Size effect
1Spurious signal noise
1Theoretical study
1Theory

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EXPLOR_STEP=IndiumV3/Data/France/Analysis

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HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i  \
                -Sk "R. Plana" \
         | HfdSelect -Kh $EXPLOR_AREA/Data/France/Analysis/biblio.hfd

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