Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « Ph. Komninou »
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Ph. Kapsa < Ph. Komninou < Ph. Krauz  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 7.
Ident.Authors (with country if any)Title
000094 (2012) Structure and strain state of polar and semipolar InGaN quantum dots
000097 (2012) Structural properties of semipolar InGaN/GaN quantum dot superlattices grown by plasma-assisted MBE
000112 (2012) Morphology and origin of V-defects in semipolar (11-22) InGaN
000217 (2011) Growth and characterization of polar (0 0 0 1) and semipolar (11-22) InGaN/GaN quantum dots
000296 (2010) Microstructure of N-face InN grown on Si (111) by plasma-assisted MBE using a thin GaN-AlN buffer layer
000766 (2006) Structural properties of quaternary InAlGaN MQW grown by plasma-assisted MBE
000943 (2005) Interfacial structure of MBE grown InN on GaN

List of associated KwdEn.i

Nombre de
documents
Descripteur
7Molecular beam epitaxy
5Gallium nitride
5Indium nitride
5Transmission electron microscopy
3III-V semiconductors
3Interfaces
3Mismatch lattice
3Quantum dots
3Threading dislocation
2Crystal structure
2Gallium nitrides
2III-V compound
2Indium
2Indium nitrides
2Inorganic compounds
2Microstructure
2Phase analysis
2Plasma assisted processing
2Self-assembly
2Semiconductor materials
2Superlattices
2Ternary compounds
1Aluminium nitride
1Aluminium nitrides
1Aluminium oxides
1Atomic clusters
1Binary compounds
1Blue shift
1Buffer layer
1Compressive stress
1Confinement
1Crystal orientation
1Crystalline material
1Dislocation annihilation
1Dislocation density
1Dislocation interactions
1Dislocation motion
1Dispersive spectrometry
1Electric field effects
1Electron beams
1Electron diffraction
1Electron microscopy
1Faceting
1Film growth
1Fluctuations
1Growth mechanism
1Indium compounds
1Interfacial area
1Lattice parameters
1Microelectronic fabrication
1Misfit dislocations
1Morphology
1Multiple quantum well
1Nanometer scale
1Nanostructured materials
1Nanostructures
1Non radiative recombination
1Nucleation
1Photoluminescence
1Polarity
1Quantum wells
1Self-assembled layers
1Silicon
1Spectral line shift
1Stacking faults
1Strain measurement
1Strains
1Stress relaxation
1Temperature dependence
1Template method
1Template reaction
1Tensile stress
1Thermal expansion coefficient
1Thermal stresses
1Thin films
1V shape

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