Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « P. Thevenin »
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P. Thedrez < P. Thevenin < P. Thibault  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 6.
Ident.Authors (with country if any)Title
000497 (2008) Study of the hBN/InP interface by deep level transient and photoluminescence spectroscopies
001438 (2000) Improved bias-thermal-stress method for the insulator charge measurement of BN/InP MIS structures
001485 (2000) Analysis of interface states of n-InP MIS structures based on bias dependence of capacitance and photoluminescence intensity
001A14 (1998) Electrical properties of MIS structures with BN insulating layer
001C20 (1997) Preparation of boron nitride thin films by microwave plasma enhanced CVD, for semiconductor applications
002187 (1995) Electrical properties of Au/Bn[BN]/InP MIS diodes

List of associated KwdEn.i

Nombre de
documents
Descripteur
5Experimental study
3CV characteristic
3Gold
3Indium phosphides
3MIS structures
2Binary compounds
2Boron nitride
2Boron nitrides
2DLTS
2III-V semiconductors
2Indium phosphide
2MIS structure
2PECVD
2Photoluminescence
2Thin films
2Voltage capacity curve
1Binary compound
1Boron Nitrides
1CVD
1Capacitance
1Chemical vapor deposition
1Conduction bands
1Electrical characteristic
1Electrical properties
1Ellipsometry
1Hexagonal crystals
1III-V compound
1Illumination
1Indium Phosphides
1Insulating material
1Integrated circuit
1Interface electron state
1Interface states
1Interfaces
1MIS diode
1Microwave circuit
1Microwave radiation
1Optical properties
1Photoelectron spectroscopy
1Plasma enhanced chemical vapor deposition
1Radio wave
1Refractive index
1Semiconductor device
1Silicon
1Surface analysis
1Surface states
1Surface structure
1Thickness
1Transients
1VLSI circuit

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HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i  \
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