Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « P. Maurel »
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P. Mathieu < P. Maurel < P. Maurin  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 31.
[0-20] [0 - 20][0 - 31][20-30][20-40]
Ident.Authors (with country if any)Title
002567 (1993) Room temperature 600mW CW output power per facet from single GaInAs/GaAs/GaInP large area laser diode grown by CBE
002642 (1993) Influence of rapid thermal annealing on the properties of strained GaInAs quantum well lasers
002659 (1993) High quality 0.98 μm GaInAs/GaAs/GaInP lasers growth by CBE using tertiarybutylarsine and tertiarybutylphosphine
002911 (1992) Direct determination of the valence-band offsets at Ga0.47In0.53As/InP and InP/Ga0.47In0.53As heterostructures by ultraviolet photoemission spectroscopy
002973 (1991) Sulfur doping of GaAs and GaInP grown by metalorganic molecular beam epitaxy using a hydrogen sulfide gaseous source
002A03 (1991) Metal-organic molecular beam epitaxy of GaAs and Ga0.5In0.5P
002A04 (1991) Metal organic molecular beam epitaxy growth of Ga0.5In0.5P/GaAs quantum well structures
002A06 (1991) MOMBE growth of high quality GaAs/GaInP heterostructures
002A10 (1991) Kinetic study of metalorganic molecular beam epitaxy of GaP, InP, and GaxIn1-xP
002A29 (1991) Ga0.51In0.49P/GaxIn1-xAs lattice-matched (x=1) and strained (x=0.85) two-dimensional electron gas field-effect transistors
002A65 (1991) Chemical beam epitaxy growth of GaAs/Ga0.5In0.5P heterostructures : growth kinetics, electrical and optical properties
002B01 (1990) The first fabrication of n- and p-type Ga0.49In0.51P/Ga(In)As lattice matched and strained HIGFET structures grown by MOCVD
002B35 (1990) MOMBE growth of high-quality InP and GalnAs bulk, heterojunction and quantum well layers
002B55 (1990) High performance GaAs/GaInP heterostructure bipolar transistors grown by low-pressure meta========???010???.horbar;organic chemical vapour deposition
002C11 (1989) Première observation d'une résistance différentielle négative dans un système à double barrière InP/Ga0,47In0,53As
002C19 (1989) Croissance et caractérisation d'hétérostructures GaAs/Ga0,49In0,51P élaborées par LP-MOCVD
002C20 (1989) Croissance et caractérisation d'alliages GaInAsP de gaps égaux à 1,3 et 1,15 μm élaborés par LP-MOCVD
002C21 (1989) Couches d'InP de très haute pureté obtenues par croissance en phase vapeur par la méthode des organométalliques
002D26 (1988) Very high purity InP epilayer grown by metalorganic chemical vapor deposition
002D90 (1988) High-quality GaInAsP/InP heterostructures grown by low-pressure metalorganic chemical vapor deposition on silicon substrates
002D91 (1988) High-quality GaAs/Ga0.49In0.51P superlattices grown on GaAs and silicon substrates by low-pressure metalorganic chemical vapor deposition

List of associated KwdEn.i

Nombre de
documents
Descripteur
16Indium Phosphides
15Epitaxy
15Heterojunction
14Experimental study
12Chemical vapor deposition
12Gallium Arsenides
12Gallium Indium Arsenides Mixed
12Inorganic compound
12Semiconductor materials
10Gallium Indium Phosphides Mixed
8Crystal growth
8Organometallic compound
7Photoluminescence
7Thin film
6Gallium Indium Arsenides phosphides Mixed
5Molecular beam condensation
5Semiconductor laser
5Temperature
4Characterization
4Microelectronic fabrication
4Quantum well
3Electrical properties
3Low pressure
3Low temperature
3Multiple quantum well
3Optical properties
3Silicon
3Superlattice
3X ray diffraction
2Chemical beam condensation
2Cyclotron resonance
2Double heterojunction
2Electron gas
2Exciton
2Field effect transistor
2Gallium Indium Phosphides
2Growth
2Impurity
2Kinetics
2Manufacturing
2Output power
2Quantum Hall effect
2Solid solution
2Voltage threshold
1Acceptor center
1Activation energy
1Advanced technology
1Application
1Asymmetry
1Band offset
1Band structure
1Bound exciton
1Buffer layer
1Buried layer
1CBE method
1CW laser
1Charge carrier mobility
1Charge carrier trapping
1Chemical composition
1Continuous wave
1Deposition
1Diode
1Distribution
1Donor center
1Doping
1Electrical conductivity
1Electron mobility
1Epitaxial film
1Excitonic process
1Far infrared radiation
1Gallium Arsenides phosphides
1Gallium Indium Arsenides Phosphides
1Gallium Phosphides
1Gallium compound
1Gases
1Growth from vapor
1Hall effect
1Hall mobility
1Heterojunction transistor
1High performance
1High purity
1Hydrostatic pressure
1Impurity density
1Impurity level
1Indium compound
1Injection laser
1Instrumentation
1Insulating material
1Integrated circuit
1Interface
1Iron
1Laminated structure
1Landau level
1Light emitting diode
1Magnetooscillatory properties
1Manufacturing process
1Molecular beam
1Monolithic integrated circuit
1Negative differential conductivity
1Operating conditions

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