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Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « P. Gall »
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P. G. Savvidis < P. Gall < P. Galle  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 11.
Ident.Authors (with country if any)Title
002367 (1994) Photon tunneling from semiconductor surfaces to atomic forcxe microscopy probes
002943 (1991) Tomographie par diffusion laser dans les mono et polycristaux : révélation et configuration tridimensionnelle des défauts
002978 (1991) Spatial investigation of an iron-doped indium phosphide ingot
002A14 (1991) Inhomogeneity in a semi-insulating indium phosphide ingot
002D44 (1988) Short range association of EL2 with dislocations in GaAs-In materials
002E12 (1988) EL2o distribution in the vicinity of dislocations in GaAs-In materials
002E68 (1987) Thermal activation of glide in InP single crystals
002E69 (1987) Thermal activation of deformation in S-doped InP single crystals
002F00 (1987) Observation of cellular structures of defects in semi-insulating InP-Fe
002F43 (1987) Defect structures in InP crystals by laser scanning tomography
003045 (1986) An experimental evidence of the destruction of complex defects by the introduction of dislocations in InP

List of associated KwdEn.i

Nombre de
documents		Descripteur
9Experimental study
8Inorganic compound
7Indium Phosphides
5Dislocation
5Impurity
4Crystal defect
4Gallium Arsenides
4Semiconductor materials
3Single crystal
2Antisite defect
2Compression
2Czochralski method
2Edge dislocation
2High temperature
2Indium
2Iron
2Optical microscopy
2Photoluminescence
2Plastic deformation
2Plasticity
2Point defect
2Point defect cluster
2Stress relaxation
2Temperature
2Tomography
2Transmission electron microscopy
2Uniaxial stress
2Vacancy
1Atomic force microscopy
1Cadmium Tellurides
1Complex defect
1Crystal growth
1Dislocation forest
1Dislocation motion
1Doping
1Hardening
1Helical dislocation
1Heterogeneity
1III-V compound
1Indium phosphide
1Instrumentation
1Interaction
1Interstitial
1Laser
1Laser beam
1Liquid encapsulation
1Microelectronic fabrication
1Near infrared radiation
1Optical properties
1Roughness
1Scanning microscope
1Screw dislocation
1Semiconductor device
1Silicon
1Sulfur
1Surface conditions
1Transmission microscope
1Tunnel effect
1Wafer
1Yttrium Oxides

Pour manipuler ce document sous Unix (Dilib)

EXPLOR_STEP=IndiumV3/Data/France/Analysis

HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i -k "P. Gall" 

HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i  \
                -Sk "P. Gall" \
         | HfdSelect -Kh $EXPLOR_AREA/Data/France/Analysis/biblio.hfd

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{{Explor lien
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   |area=    IndiumV3
   |flux=    France
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   |clé=    P. Gall
}}
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