Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « P. Crozat »
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P. Cremillieu < P. Crozat < P. D. Berger  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 14.
Ident.Authors (with country if any)Title
000735 (2007) 1.55μm InP-based electrically-pumped VECSELs : comparison of buried and implanted tunnel junctions as current confinement schemes for the realization of large diameter devices
000B99 (2003-12-29) Ultrafast response (∼2.2 ps) of ion-irradiated InGaAs photoconductive switch at 1.55 μm
000C60 (2003-02-10) Thermal stability of ion-irradiated InGaAs with (sub-) picosecond carrier lifetime
000D78 (2003) Electrical properties of 1.55 μm sensitive ion-irradiated Ingaas with subpicosecond carrier lifetime
001943 (1998) Reduced timing jitter of two-section 1.55-μm laser diodes under gain-/loss-switching regime at multigigahertz rates
001D78 (1996-07-01) Low temperature electroluminescence spectroscopy of high electron mobility transistors on InP
001F51 (1996) Enhancements and degradations in ultrashort gate GaAs and InP HEMTs properties at cryogenic temperatures : an overview
002063 (1995-03-01) Electroluminescence spectroscopy of AlGaAs/InGaAs and AlGaAs/GaAs high-electron-mobility transistors
002386 (1994) Low temperature low voltage operation of HEMTs on InP
002400 (1994) High electric field transport effects on low temperature operation of pseudomorphic HEMTs
002563 (1993) Scaling behavior of delta-doped AlGaAs/InGaAs high electron mobility transistors with gatelengths down to 60 nm and source-drain gaps down to 230 nm
002667 (1993) Gate length electric parameter dependences of ultra-submicrometre δ-doped pseudomorphic HEMTs
002714 (1993) Cryogenic investigation of gate leakage and RF performance down to 50K of 0.2μm AlInAs/GaInAs/InP HEMT's
002819 (1992) Picosecond large-signal switching characteristics of a pseudomorphic AIGaAs/InGaAs modulated doped field effect transistor

List of associated KwdEn.i

Nombre de
documents
Descripteur
8Experimental study
7High electron mobility transistor
5Gallium Arsenides
4Semiconductor device
3Field effect transistor
3Gallium Indium Arsenides Mixed
3Gallium arsenides
3III-V semiconductors
3Indium Phosphides
2Aluminium Arsenides
2Aluminium Gallium Arsenides Mixed
2Binary compound
2Cryogenic temperature
2Cut off frequency
2Electrical characteristic
2Indium Arsenides
2Indium compounds
2Ion beam effects
2Low temperature
2Performance characteristic
2Planar doping
2Semiconductor lasers
2Size effect
2Ternary compound
2Transport process
1Aluminium Gallium Arsenides
1Aluminium Indium Arsenides Mixed
1Amorphous state
1Annealing
1Binary compounds
1Bragg reflection
1Carrier concentration
1Carrier lifetime
1Carrier lifetimes
1Carrier mobility
1Current voltage characteristics
1Defect states
1Dielectric materials
1Electrical properties
1Electroluminescence
1Electron mobility
1Electrooptics
1Emission spectra
1Experiments
1External cavity
1Field effect transistors
1Frenkel defects
1Gain switching
1Hall effect
1III-V compound
1Indium Gallium Arsenides
1Indium arsenides
1Indium phosphides
1Injection current
1Ion bombardment
1Ion implantation
1Large signal behavior
1Laser materials
1Laser modes
1Laser pulses
1Leakage current
1Loss switching
1Measurement
1Microelectronic fabrication
1Microwave device
1Microwave transistor
1Mirrors
1Optical materials
1Optical pulse generation
1Optical pumping
1Output power
1Performance
1Photoconducting devices
1Photoconducting switches
1Picosecond
1Picosecond pulses
1Production process
1Proton effects
1Pseudomorphic device
1Radiative lifetimes
1Radiofrequency
1Recombination
1Semiconducting gallium arsenide
1Semiconducting indium gallium arsenide
1Semiconducting indium phosphide
1Semiconductor device models
1Semiconductor epitaxial layers
1Surface emitting lasers
1Switching
1Switching time
1Temperature dependence
1Ternary compounds
1Theory
1Thermal stability
1Timing jitter
1Transconductance
1Transistor gate
1Transition frequency
1Transmission electron microscopy
1Transverse mode

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