Auteurs
Analysis
France
Racine
Analysis
France
Repository
Accueil
Racine
Racine

Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « O. Tottereau »
Attention, ce site est en cours de développement !
Attention, site généré par des moyens informatiques à partir de corpus bruts.
Les informations ne sont donc pas validées.
O. Tesson < O. Tottereau < O. Trovarelli  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 6.
Ident.Authors (with country if any)Title
000449 (2009) Heteroepitaxial growth of thin InAs layers on GaAs(100) misoriented substrates: A structural and morphological comparison
000495 (2008) Subsurface Fe-doped semi-insulating GaN templates for inhibition of regrowth interface pollution in AlGaN/GaN HEMT structures
000730 (2007) AlGaN/GaN HEMTs regrown by MBE on epi-ready semi-insulating GaN-on-sapphire with inhibited interface contamination
000A19 (2005) Alumina-rich spinel : A new substrate for the growth of high quality GaN-based light-emitting diodes
001312 (2000-10-02) Long wavelength GaInNAs/GaAs quantum-well heterostructures grown by solid-source molecular-beam epitaxy
001B34 (1997-04-15) Surface segregation in (Ga,In)As/GaAs quantum boxes

List of associated KwdEn.i

Nombre de
documents		Descripteur
4III-V semiconductors
4Molecular beam epitaxy
3Experimental study
3Gallium nitride
3MOVPE method
3Photoluminescence
2Atomic force microscopy
2High electron mobility transistor
2Indium addition
2Indium compounds
2Interface
2Leakage current
2Template reaction
2Two-dimensional electron gas
2VPE
1Aluminium nitride
1Arsenic compounds
1Bias voltage
1Bound exciton
1Charge carrier density
1Chemical vapor deposition
1Crystal growth from vapors
1Crystal orientation
1Doping
1Doping profile
1Electroluminescence
1Electron mobility
1Energy levels
1Epitaxial layers
1Gallium arsenides
1Gallium compounds
1Gates
1Heteroepitaxy
1Indium arsenides
1Indium nitride
1Iron
1Iron addition
1Island structure
1Light emitting diode
1MOCVD
1Misfit dislocation
1Morphology
1Organometallic compound
1RHEED
1Reflectivity
1Roughness
1STM
1Semiconductor growth
1Semiconductor quantum wells
1Silicon
1Silicon addition
1Surface reconstruction
1Surface segregation
1Thick film
1Thickness
1Thin films
1XRD

Pour manipuler ce document sous Unix (Dilib)

EXPLOR_STEP=IndiumV3/Data/France/Analysis

HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i -k "O. Tottereau" 

HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i  \
                -Sk "O. Tottereau" \
         | HfdSelect -Kh $EXPLOR_AREA/Data/France/Analysis/biblio.hfd

Pour mettre un lien sur cette page dans le réseau Wicri

{{Explor lien
   |wiki=   *** parameter Area/wikiCode missing *** 
   |area=    IndiumV3
   |flux=    France
   |étape=   Analysis
   |type=    indexItem
   |index=    Author.i
   |clé=    O. Tottereau
}}
Wicri

This area was generated with Dilib version V0.5.77.
Data generation: Mon Jun 9 10:27:54 2014. Site generation: Thu Mar 7 16:19:59 2024