Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « M. Zazoui »
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M. Zarcone < M. Zazoui < M. Zegaoui  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 9.
Ident.Authors (with country if any)Title
000923 (2005) Non-empirical prediction of solar cell degradation in space
000C41 (2003-05-01) Analysis of multijunction solar cell degradation in space and irradiation induced recombination centers
000E56 (2002-06-10) Space degradation of multijunction solar cells: An electroluminescence study
000F77 (2002) Mechanism of irradiation induced degradation of solar cells
000F91 (2002) Irradiation-induced degradation in solar cell: characterization of recombination centres
002682 (1993) Electronic transport through semiconductor barriers
002709 (1993) Defects in epitaxial Si-doped GaInP
002710 (1993) Defects in electron irradiated GaInP
002917 (1992) Defect characterization in GaAlInAs alloys

List of associated KwdEn.i

Nombre de
documents
Descripteur
6Experimental study
6Gallium arsenides
5Semiconductor materials
3Gallium phosphide
3Germanium
3Indium phosphide
3Inorganic compound
3Short circuit currents
3Solar cell
2Barrier
2Charge carrier trapping
2DLTS
2Deep level transient spectrometry
2Defect level
2Defect states
2Doping
2Electric field effects
2Electroluminescence
2Electron beam
2Electron beam effects
2Fluence
2Gallium compounds
2Gallium phosphides
2III-V semiconductors
2Indium compounds
2Indium phosphides
2Open circuit voltage
2Silicon
2Solar cells
2Ternary compounds
1Aluminium Gallium Arsenides Mixed
1Aluminium arsenides
1Band offset
1Binary compound
1Binary compounds
1CV characteristic
1Carrier density
1Charge carrier concentration
1Charge carrier recombination
1Charge carriers
1Complex defect
1Cross section (collision)
1Cross sections
1Degradation
1Donors
1Doped materials
1Electron emission
1Electron-hole recombination
1Electrons
1Elemental semiconductors
1Fowler-Nordheim theory
1Free carrier
1Gallium Indium Phosphides Mixed
1Heterojunctions
1IV characteristic
1Impurity density
1Indium
1Ionization potential
1Irradiation
1Irradiation defect
1Measurement
1Modeling
1Non radiative recombination
1Nonradiative transitions
1Photoconductivity
1Physical radiation effects
1Proton beam
1Radiation damage
1Radiation effect
1Radiation hardening (electronics)
1Recombination center
1Rectangular configuration
1Semiconductor device measurement
1Semiconductor device testing
1Silicon additions
1Temperature
1Temperature dependence
1Temperature effects
1Ternary compound
1Theoretical study
1Thickness
1Thin films
1Transport processes
1Trapping
1Triangular configuration
1Variational techniques
1Voltage capacity curve
1Voltage current curve

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