Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « M. Zaknoune »
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M. Zahzouh < M. Zaknoune < M. Zarcone  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 23.
[0-20] [0 - 20][0 - 23][20-22][20-40]
Ident.Authors (with country if any)Title
000143 (2012) 480-GHz fmax in InP/GaAsSb/InP DHBT With New Base Isolation μ-Airbridge Design
000666 (2007) MBE growth of heavily carbon doped GaAsSb on InP for heterojunction bipolar transistor applications
000827 (2006) Free-carrier absorption and growth temperature of highly Be-doped InGaAs in molecular beam epitaxy
000954 (2005) High performances of InP channel power HEMT at 94 GHz
000A13 (2005) CBr4 and be heavily doped InGaAs grown in a production MBE system
000A22 (2005) 94 GHz high power performances of InAs0,4P0.6 channel HEMTs on InP
000B78 (2004) Boundary conditions for realistic simulation of ultra short pseudomorphic high electron mobility transistor on indium phosphide substrates
000D34 (2003) Metamorphic InAlAs/InGaAs HEMTs: Material properties and device performance
000E11 (2003) 60-GHz High Power Performance In0.35Al0.65As-In 0.35Ga 0.65As Metamorphic HEMTs on GaAs
000E58 (2002-06-03) Electron lifetime of heavily Be-doped In0.53Ga0.47As as a function of growth temperature and doping density
000E91 (2002) fmax of 490 GHz metamorphic In0.52Al0.48As/In0.53Ga 0.47As HEMTs on GaAs substrate
001059 (2001-12-01) Stacking of metamorphic InAlAs/InGaAs heterostructures on GaAs substrate
001431 (2000) Indium content in metamorphic InxAl1-xAs/InxGa1-xAs HEMTs on GaAs substrate: A new structure parameter
001494 (2000) 0.1-μm high performance double heterojunction In0.32Al0.68As/In0.33Ga0.67As metamorphic HEMTs on GaAs
001624 (1999) HEMTS métamorphiques à hétérojonction InxAl1-xAs/InxGa1-xAs sur substrat gaas : Influence du taux d'indium x
001700 (1999) Metamorphic In0.4Al0.6As/In0.4Ga0.6As HEMT's on GaAs substrate
001715 (1999) Influence on power performances at 60 GHz of indium composition in metamorphic HEMTs
001726 (1999) High-power V-band Ga0.51In0.49P/In0.2Ga0.8As pseudomorphic HEMT grown by gas source molecular beam epitaxy
001786 (1999) 0.1μm Ga0.51In0.49P/In0.2Ga0.8As PHEMT grown by GSMBE with high DC and RF performances
001787 (1999) 0.1 μm high performance metamorphic In0.32Al0.68As/In0.33Ga0.67As HEMT on GaAs using inverse step InAlAs buffer
001788 (1999) 0.1 μm (Al0.5Ga0.5)0.5In0.5P/In0.2Ga0.8As/GaAs PHEMT grown by gas source molecular beam epitaxy

List of associated KwdEn.i

Nombre de
documents
Descripteur
12High electron mobility transistors
9Current density
9Molecular beam epitaxy
8Experiments
7Experimental study
7Gallium arsenides
7III-V semiconductors
7Transconductance
6Heterojunctions
6Semiconducting indium gallium arsenide
5Semiconductor doping
5Ternary compound
5Theory
4Electron transport properties
4High electron mobility transistor
4Indium arsenides
4Indium compounds
4Power gain
4Semiconducting gallium arsenide
4Substrates
3Crystal growth from vapors
3Doping
3Indium aluminum arsenide
3Indium phosphide
3Ohmic contacts
3Performance evaluation
3Semiconductor growth
2Aluminium compounds
2Binary compound
2Bipolar transistors
2Carbon additions
2Carrier concentration
2Carrier mobility
2Composite material
2Composition effects
2Current gain
2Diffusion
2Dislocations (crystals)
2Drain voltage
2Electric power measurement
2Electron mobility
2Etching
2GSMBE method
2Heterojunction bipolar transistors
2High performance
2III-V compound
2Optimization
2Output power
2Semiconducting indium compounds
2Semiconductor device manufacture
2Semiconductor device structures
2Solid source molecular beam epitaxy
2Temperature dependence
1Absorption spectrum
1Aluminium arsenides
1Aluminum
1Anomaly
1Atomic force microscopy
1Auger effect
1Background noise
1Base collector junction
1Beryllium
1Beryllium addition
1Beryllium additions
1Bipolar transistor
1Boundary conditions
1Buffer layer
1Capacitance
1Carrier lifetime
1Chemical vapor deposition
1Common emitter
1Composition effect
1Computer simulation
1Current voltage characteristics
1Cut off frequency
1Defect states
1Dirichlet conditions
1Dislocations
1Disruptive voltage
1Double heterojunction metamorphic high electron mobility transistors
1Electric breakdown
1Electric breakdown of solids
1Electric currents
1Electric potential
1Electrical characteristic
1Electron beams
1Epilayers
1Epitaxy
1Equivalent circuits
1Extrinsic transconductance
1Field effect transistor
1Free carrier
1Frequencies
1Frequency characteristic
1Gallium Arsenides
1Gallium Phosphides
1Gallium antimonides
1Gallium compounds
1Gas source molecular beam epitaxy
1Gate current

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