Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « M. Heuken »
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M. Hervieu < M. Heuken < M. Heyen  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 8.
Ident.Authors (with country if any)Title
000260 (2010) The structure of InAlN/GaN heterostructures for high electron mobility transistors
000411 (2009) Optical, structural investigations and band-gap bowing parameter of GaInN alloys
000421 (2009) MOVPE growth of InN buffer layers on sapphire
000438 (2009) InN excitonic deformation potentials determined experimentally
000452 (2009) Growth of InN films and nanostructures by MOVPE
000474 (2009) Alternative precursors for MOVPE growth of InN and GaN at low temperature
001146 (2001) Temperature dependent electroluminescence in GaN and InGaN/GaN LEDs
001335 (2000-05-01) InAs(PSb)-based W quantum well laser diodes emitting near 3.3 μm

List of associated KwdEn.i

Nombre de
documents
Descripteur
6Gallium nitride
6Indium nitride
5MOCVD
5MOVPE method
4Growth mechanism
4III-V compound
4III-V semiconductors
3Thin films
3VPE
2Atomic force microscopy
2Heterostructures
2Photoluminescence
1Adatoms
1Aluminium Indium Nitrides Mixed
1Ammonia
1Binary compound
1Buffer layer
1Carbon
1Carrier density
1Charge carrier recombination
1Crystal chemistry
1Crystal perfection
1Crystal structure
1Crystallinity
1Current density
1Damage
1Deformation potential
1Doping
1Droplets
1Electronic properties
1Energy gap
1Epitaxial layers
1Experimental study
1Free carrier
1Growth rate
1Halides
1High electron mobility transistors
1Indium
1Indium compounds
1Interfacial layer
1Island structure
1Lateral growth
1Light emitting diode
1Line shape
1Line widths
1Molecular beam epitaxy
1Nanostructures
1Nitridation
1Operating conditions
1Optical characteristic
1Optimization
1Organic hydrazine
1Performance evaluation
1Precursor
1Quantum well lasers
1Recrystallization
1Sapphire
1Semiconductor materials
1Surface morphology
1Surface states
1Temperature effect
1Ternary compound
1Thick films
1Thickness
1Transmission electron microscopy
1Transport process

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