Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « L. Auvray »
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L. Auvert-Colin < L. Auvray < L. B. Elouga Bom  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 7.
Ident.Authors (with country if any)Title
000268 (2010) Structural and optical study of BxInyGa1-x-yAs/GaAs and InyGa1-yAs/GaAs QW's grown by MOCVD
000B54 (2004) Enhancement of atomic ordering in In0.53Ga0.47As/InP: a comparison between trimethylarsenic and arsine
000D18 (2003) Optical signature of atomic ordering in In0.53Ga0.47As/InP: photoluminescence properties and IR response
001571 (1999-05-15) Strain-induced surface morphology of slightly mismatched InxGa1-xAs films grown on vicinal (100) InP substrates
001647 (1999) Surface morphology, electrical and optical properties of In0.53Ga0.47As/InP grown by metalorganic vapor-phase epitaxy using trimethylarsine and arsine
001648 (1999) Surface morphology of InGaAs and InP materials grown with trimethylarsenic and arsine on vicinal InP substrates
001729 (1999) Growth mode and effect of carrier gas on In0.53Ga0.47As/InP surface morphology grown with trimethylarsine and arsine

List of associated KwdEn.i

Nombre de
documents
Descripteur
7Gallium arsenides
5Atomic force microscopy
5Experimental study
5Indium arsenides
5Ternary compounds
4Indium phosphides
4MOVPE method
4Morphology
4Photoluminescence
3Crystal growth from vapors
3Epitaxial layers
3III-V semiconductors
3Mismatch lattice
3Semiconductor materials
2Binary compounds
2MOCVD
2Precursor
2Semiconductor epitaxial layers
2Surface structure
2Surfaces
2VPE
1Arsine
1Boron additions
1Buffer layer
1Charge carrier recombination
1Dislocations
1Electron diffraction
1Electron mobility
1Excitons
1Gallium Indium Arsenides Mixed
1Growth mechanism
1Hall effect
1Heterojunctions
1Impurities
1Indium compounds
1Infrared spectra
1Localized states
1Microstructure
1Optical materials
1Organic arsine
1Quantum wells
1Semiconductor growth
1Substrates
1Surface topography
1Temperature dependence
1Temperature effects
1Tertiary arsine
1Thin films
1Transmission electron microscopy
1Vicinal surface
1XRD

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HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i  \
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