IndiumV3, France, Analysis, indexItem, Author.i, J. Y. Laval

J. Y. Labandibar < J. Y. Laval < J. Y. Lesiourd

Facettes :

List of bibliographic references

Number of relevant bibliographic references: 7.

Ident.	Authors (with country if any)	Title
001543 (1999-08-15)		High resolution electron microscope analysis of lattice distortions and In segregation in highly strained In0.35Ga0.65As coherent islands grown on GaAs (001)
001706 (1999)		Local stress in highly strained coherent InGaAs islands
001A33 (1998)		Atomic-scale mapping of local lattice distortions in highly strained coherent islands of InxGa1-xAs/GaAs by high-resolution electron microscopy and image processing
001D19 (1997)		2D-3D transition in highly strained GaAs/Ga1-xInxAs heterostructures by transmission electron microscopy
001F59 (1996)		Dislocation introduction in the initial stages of MBE growth of highly strained In0.30Ga0.70As/GaAs structures
002653 (1993)		Improvement of the growth of InxGa1-xAs on GaAs (001) using Te as surfactant
002E64 (1987)		Two-dimensional defects in InSe

List of associated KwdEn.i

Nombre de documents	Descripteur
7	Experimental study
5	Gallium arsenides
4	Indium arsenides
4	Molecular beam epitaxy
4	Semiconductor materials
4	TEM
4	Ternary compounds
3	Heterojunctions
3	Island structure
3	Stresses
3	Thin films
2	Binary compounds
2	Crystal growth
2	Epitaxial layers
2	Growth mechanism
2	Inorganic compound
2	Roughness
2	Strained layer
2	Stress relaxation
1	Atomic layer method
1	Characterization
1	Charge carrier concentration
1	Charge carrier mobility
1	Chemical composition
1	Coalescence
1	Crystal growth from vapors
1	Crystal nucleation
1	Dislocations
1	Electron microprobe
1	Epitaxy
1	Finite element method
1	Fourier analysis
1	Gallium Indium Arsenides Mixed
1	Hall effect
1	Heteroepitaxy
1	High-resolution methods
1	III-V semiconductors
1	Image processing
1	Impurity segregation
1	Indium Selenides
1	Indium compounds
1	Lamellar compound
1	Lattice distortion
1	Lattice image
1	Lattice relaxation
1	Low temperature
1	Molecular beam condensation
1	Non stoichiometric composition
1	Operating mode
1	Planar defect
1	Precipitation
1	Quantum dots
1	Semiconductor epitaxial layers
1	Solid solutions
1	Solid-solid interfaces
1	Stacking fault
1	Surface defect
1	Surface segregation
1	Surface structure
1	Surfaces
1	Surfactant
1	Surfactants
1	Tellurium
1	Temperature
1	Temperature effects
1	Thickness
1	Thin film
1	Tin
1	Transmission electron microscopy

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EXPLOR_STEP=IndiumV3/Data/France/Analysis

HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i -k "J. Y. Laval"

HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i  \
                -Sk "J. Y. Laval" \
         | HfdSelect -Kh $EXPLOR_AREA/Data/France/Analysis/biblio.hfd

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   |area=    IndiumV3
   |flux=    France
   |étape=   Analysis
   |type=    indexItem
   |index=    Author.i
   |clé=    J. Y. Laval
}}

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Serveur d'exploration sur l'Indium - Analysis (France)Index « Auteurs » - entrée « J. Y. Laval »

List of bibliographic references

List of associated KwdEn.i

Pour manipuler ce document sous Unix (Dilib)

Pour mettre un lien sur cette page dans le réseau Wicri

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Index « Auteurs » - entrée « J. Y. Laval »