Auteurs
Analysis
France
Racine
Analysis
France
Repository
Accueil
Racine
Racine

Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « J. Vigneron »
Attention, ce site est en cours de développement !
Attention, site généré par des moyens informatiques à partir de corpus bruts.
Les informations ne sont donc pas validées.
J. Vigeron < J. Vigneron < J. Visset  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 8.
Ident.Authors (with country if any)Title
000360 (2010) An ARXPS study of the passivating layer formed on III-V surface by an innovative anodic treatment in liquid ammonia
000C90 (2003) Studies of buried interfaces Cu(In, Ga)Se2/CdS XPS and electrical investigations
000D92 (2003) Chemical elaboration of well defined Cu(In, Ga)Se2 surfaces after aqueous oxidation etching
000E92 (2002) XPS and electrical studies of buried interfaces in Cu(In, Ga)Se2 solar cells
001005 (2002) High resolution XPS studies of Se chemistry of a Cu(In, Ga)Se2 surface
001038 (2002) Cathodic decomposition of InP studied by XPS
001135 (2001) Thin anodic oxides on n-InP studied by photocurrent transients and surface analysis
002334 (1994) Mise en évidence des mécanismes d'injection de porteurs majoritaires à l'interface semiconducteur/électrolyte

List of associated KwdEn.i

Nombre de
documents		Descripteur
4Copper selenides
4Experimental study
4Gallium selenides
4Indium selenides
4X-ray photoelectron spectra
2III-V semiconductors
2Indium phosphides
2Interface
2Photoelectron spectrometry
2Solar cell
2Surface states
1Anodic oxide
1Binary compound
1Buried layer
1Cadmium sulfide
1Carrier density
1Cathodic reaction
1Charge carriers
1Chemical bath deposition
1Chemical composition
1Concentration distribution
1Cyclic voltammetry
1Electric admittance
1Electrochemical reaction
1Etching
1Fabrication property relation
1Gallium arsenides
1Heterojunction
1Impurity
1Indium Phosphides
1Indium phosphide
1Injection
1Inorganic compounds
1Liquid state
1Majority carrier
1Modified material
1Modulation
1Oxidation
1Passivation
1Photocurrents
1Photoelectric current
1Photoelectrochemistry
1Polycrystals
1Profilometry
1Quaternary compound
1Quaternary compounds
1Roughness
1Scanning electron microscopy
1Semiconductor electrolytic contacts
1Semiconductor materials
1Stoichiometry
1Surface analysis
1Surface composition
1Surface layers
1Surface photovoltage
1Surface structure
1Thin films
1Transients
1X ray
1n type semiconductor

Pour manipuler ce document sous Unix (Dilib)

EXPLOR_STEP=IndiumV3/Data/France/Analysis

HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i -k "J. Vigneron" 

HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i  \
                -Sk "J. Vigneron" \
         | HfdSelect -Kh $EXPLOR_AREA/Data/France/Analysis/biblio.hfd

Pour mettre un lien sur cette page dans le réseau Wicri

{{Explor lien
   |wiki=   *** parameter Area/wikiCode missing *** 
   |area=    IndiumV3
   |flux=    France
   |étape=   Analysis
   |type=    indexItem
   |index=    Author.i
   |clé=    J. Vigneron
}}
Wicri

This area was generated with Dilib version V0.5.77.
Data generation: Mon Jun 9 10:27:54 2014. Site generation: Thu Mar 7 16:19:59 2024