Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « J. Tardy »
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J. Tamaki < J. Tardy < J. Tasselli  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 11.
Ident.Authors (with country if any)Title
000D56 (2003) ITO-on-top organic light-emitting devices: a correlated study of opto-electronic and structural characteristics
000F33 (2002) Reactive ion etching of sol-gel-processed SnO2 transparent conducting oxide as a new material for organic light emitting diodes
001D32 (1996-12) Caractérisation électrique du matériau AlInAs élaboré par épitaxie par jets moléculaires à basse température
001E73 (1996) Stability and noise of Pd-Ge-Ag-Au ohmic contacts to InGaAs-InAlAs high electron mobility transistors
001F09 (1996) Low frequency noise sources in InAlAs/InGaAs MODFET's
001F29 (1996) Highly sensitive In0.75Ga0.25As/AlInAs Hall sensors
002170 (1995) High-sensitivity Hall sensors using GaInAs/AlInAs pseudomorphic heterostructures
002325 (1994-01-01) Carrier compensation induced by rapid thermal annealing in undoped InP
002426 (1994) Deep-level characterization of AlxIn1-xAs layers grown by low pressure metal-organic chemical vapor deposition
002744 (1993) A new encapsulation method of InP during post implantation annealing
002D43 (1988) Silver on phosphorus-passivated (100) InP. Interface formation and microstructure

List of associated KwdEn.i

Nombre de
documents
Descripteur
7Experimental study
6Indium arsenides
6Ternary compounds
4Aluminium arsenides
4Gallium arsenides
4Molecular beam epitaxy
3Hall effect
2Annealing
2DLTS
2Heterostructures
2High electron mobility transistors
2III-V compound
2Indium phosphides
2Magnetic fields
2Ohmic contacts
2SIMS
2Schottky barrier diodes
2Semiconducting indium compounds
2Sensitivity
2Sensors
2Signal noise measurement
2Thin film
2Thin films
2Tin oxide
2Transmission electron microscopy
11/f noise
1Admittance
1Anode
1Application
1Atomic force microscopy
1Auger electron spectrometry
1Binary compound
1Binary compounds
1Buffer layers
1CV characteristic
1CVD
1Characterization
1Charge carrier density
1Charge compensation
1Computer simulation
1Contact resistance
1Contamination
1Coverage rate
1Deep energy levels
1Deep level
1Defect states
1Drain current fluctuations
1Electric currents
1Electrode material
1Electron diffraction
1Encapsulation
1Epitaxial layers
1Epitaxy
1Equivalent circuits
1Experiments
1Fabrication
1Gates (transistor)
1Gold
1Growth
1Heat treatment
1Heterojunctions
1High resolution
1III-V semiconductors
1Impurity effect
1Indium Phosphides
1Indium oxide
1Inorganic compounds
1Instrumentation
1Insulating material
1Interface
1Ion implantation
1Iron additions
1Kinetics
1Light emitting diode
1Low frequency noise
1Low frequency noise measurements
1Mathematical models
1Metallization
1Microstructure
1Modeling
1Modulation doped field effect transistors
1Morphology
1Multiple layer
1Operating mode
1Optimized growth interruption
1Organic compounds
1Organometallic compounds
1Palladium
1Passivation
1Performance evaluation
1Photoelectron spectrometry
1Pseudomorphic growth
1Radiofrequency sputtering
1Reactive ion etching
1Roughness
1Semiconducting germanium
1Semiconductor device structures
1Semiconductor materials
1Signal to noise ratio
1Signal-to-noise ratio

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