Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « J. Flicstein »
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J. Fleury < J. Flicstein < J. Flouquet  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 6.
Ident.Authors (with country if any)Title
001045 (2002) Anomalous thermal redistribution of beryllium implanted in InGaAs: a possible interaction with extended defects
001699 (1999) Modeling and dynamic simulation of ultraviolet induced growing interfaces
001A42 (1998) A Monte carlo simulation of silicon nitride thin film microstructure in ultraviolet localized-chemical vapor deposition
002731 (1993) Bulk and surface properties of RTCVD Si3N4 films for optical device applications
002912 (1992) Differences in the SiO2/InP interfaces obtained by thermal and UV-induced chemical vapour deposition
002B98 (1990) A combination of rapid thermal processing and photochemical deposition for the growth of SiO2 suitable for InP device applications

List of associated KwdEn.i

Nombre de
documents
Descripteur
3CVD
3Silicon nitrides
3Thin films
2Chemical vapor deposition
2Experimental study
2III-V semiconductors
2Indium Phosphides
2Monte Carlo methods
2Rapid thermal annealing
2Theoretical study
1Beryllium additions
1Binary compounds
1Characterization
1Computerized simulation
1Crystal defect interaction
1Crystal doping
1Deposition
1Dielectric materials
1Diffusion
1Doping profiles
1Epitaxial layers
1Fabrication structure relation
1Gallium arsenides
1Hydrogen additions
1Impurity diffusion
1Indium arsenides
1Indium phosphides
1Infrared absorption
1Infrared spectrometry
1Interface
1Ion implantation
1Microstructure
1Modelling
1Morphology
1Nucleation
1Optical properties
1Oxide layer
1Phosphorus ions
1Photochemical method
1Photoelectron spectrometry
1Photolysis
1Refractive index
1Roughness
1SIMS
1Silica
1Silicon Oxides
1Simulation
1Supports
1Surface analysis
1Surface structure
1Thickness
1Thin film
1Ultraviolet radiation

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