Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « H. L Haridon »
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List of bibliographic references

Number of relevant bibliographic references: 24.
[0-20] [0 - 20][0 - 24][20-23][20-40]
Ident.Authors (with country if any)Title
001697 (1999) Multiple quantum well optically addressed spatial light modulators operating at 1.55 μm with high diffraction efficiency and high sensitivity
001918 (1998) The effect of the growth procedure and the InAs amount on the formation of strain-induced islands in the InAs/InP(001) system
001998 (1998) High photoluminescence efficiency of InAs/InP self-assembled quantum dots emitting at 1.5-1.6 μm
001D21 (1997) photodiffraction in InGaAs/InGaAsP multiple quantum wells enclosed in a microcavity
001D87 (1996-06-17) Photorefractive p-i-n diode quantum well operating at 1.55 μm
001E72 (1996) Structural aspects of the growth of InAs islands on InP substrate
002018 (1995-09-25) Relationship between self-organization and size of InAs islands on InP(001) grown by gas-source molecular beam epitaxy
002123 (1995) Simulation and photoluminescence characterization of transverse electric-transverse magnetic emission of strained Ga0.47In0.53As/Ga062In038As superlattices
002562 (1993) Scanning photoluminescence characterization of iron-doped gas source molecular beam epitaxy indium phosphide layers
002978 (1991) Spatial investigation of an iron-doped indium phosphide ingot
002A14 (1991) Inhomogeneity in a semi-insulating indium phosphide ingot
002B08 (1990) Spatial distribution of donors in silicon implanted iron and iron-gallium doped semi-insulating indium phosphide
002B90 (1990) Assessment of Fe-doped semi-insulating InP crystals by scanning photoluminescence measurements
002B93 (1990) Angle resolved X-ray photoemission study of rapid thermal annealing applied to different GaAs and InP samples
002C17 (1989) Dopage béryllium de couches InGaAs élaborées par épitaxie jet moléculaire: étude de la compensation
002C48 (1989) Oxygen complexes in III-V compounds as determined by secondary-ion mass spectrometry under cesium bombardment
002D47 (1988) Schottky and field-effect transistor fabrication on InP and GalnAs
002E07 (1988) Erbium implanted in III-V materials
002E26 (1988) Behaviour of erbium implanted in InP
002E90 (1987) Residual defect center in GaInAs/InP films grown by molecular beam epitaxy
002F01 (1987) Nondiffusion and 1•54 μm luminescence of erbium implanted in InP

List of associated KwdEn.i

Nombre de
documents
Descripteur
15Experimental study
9Photoluminescence
9Semiconductor materials
8Indium Phosphides
8Inorganic compound
7Impurity
6Gallium Indium Arsenides Mixed
6Indium arsenides
5Crystal growth
5Indium phosphides
4Ion implantation
4Secondary ion mass spectrometry
3Beryllium
3Epitaxy
3Erbium
3Gallium Arsenides
3Gallium arsenides
3III-V compound
3Iron
3Quantum dots
3Temperature
3Ternary compounds
2Concentration distribution
2Deep level transient spectrometry
2Diffraction efficiency
2Donor center
2Doping
2Epitaxial film
2Gallium phosphides
2Molecular beam condensation
2Molecular beam epitaxy
2Multiple quantum well
2Optical properties
2Oxygen
2Quaternary compounds
2TEM
2Thin film
1Acceptor center
1Aluminium Gallium Arsenides Mixed
1Amorphization
1Angle
1Annealing
1Band structure
1Barrier height
1Binary compounds
1Characterization
1Charge carrier concentration
1Charge carrier mobility
1Compensation
1Compounded structure
1Concentration effect
1Contamination
1Czochralski method
1Defect level
1Diffraction gratings
1Dislocation
1Elastic relaxation mechanism
1Elasticity
1Electric resistivity
1Electrical properties
1Electromagnetic wave diffraction
1Electron transitions
1Energy gap
1Experiments
1Extended defect
1Fabrication structure relation
1Field effect transistor
1Four-wave mixing
1GSMBE method
1Gallium Indium Arsenides phosphides Mixed
1Gold
1Hall effect
1Heat treatment
1Heteroepitaxy
1Heterogeneity
1Heterostructures
1High temperature
1Impurity diffusion
1Impurity level
1Indium arsenide
1Infrared radiation
1Inversion layer
1Island density
1Island spatial distribution
1Island structure
1Junction
1Laser
1Light emitting device
1Low temperature
1Magnesium
1Mathematical models
1Measurement
1Mercury
1Metal semiconductor field effect transistor
1Microcavity
1Molecular beam
1Monolayers
1N type conductivity
1Nanostructures
1Nonlinear optics

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