Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « H. Guegan »
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H. Gomez Meier < H. Guegan < H. Guenegou  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 5.
Ident.Authors (with country if any)Title
001E82 (1996) Rutherford backscattering spectrometry, particle induced X-ray emission and atomic force microscopy of InAs thin films grown on GaAs : a complementary study
002869 (1992) Indium fluoride thin films prepared by sublimation under vacuum
002891 (1992) Heteroepitaxial growth and characterization of SrF2/(100)InP
002B60 (1990) Fluorine-gas treatment of InP(100) : physico-chemical characterization of the obtained components
002E23 (1988) Characterization of SrF2 thin films and of SrF2/InP structures

List of associated KwdEn.i

Nombre de
documents
Descripteur
5Experimental study
4Rutherford backscattering
3Crystal face
3Indium Phosphides
3Thin film
2Chemical composition
2Crystal growth
2Heterojunction
2Inorganic compound
2Semiconductor materials
2Strontium Fluorides
2X ray diffraction
1Atomic force microscopy
1Backscattering
1Contamination
1Energy gap
1Fluorine
1Gas solid adsorption
1Gas solid interface
1Growth from vapor
1Heat treatment
1Heteroepitaxy
1High temperature
1III-V compound
1III-V semiconductors
1Indium Fluorides
1Indium arsenides
1Infrared spectrometry
1Inorganic adsorbate
1Inorganic adsorbent
1Mass spectrometry
1Microstructure
1Operating conditions
1Optical absorption
1Oxidation
1Photoelectron spectrum
1Physicochemical properties
1Preferred orientation
1Preparation
1Scanning electron microscopy
1Single crystal
1Stoichiometry
1Sublimation
1Support
1Surface structure
1Temperature
1Thickness
1Thin films
1X ray
1X-ray spectroscopy

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HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i  \
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