Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « G. Post »
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G. Pont < G. Post < G. Primot  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 19.
Ident.Authors (with country if any)Title
000A74 (2004) Structural studies of nano/micrometric semiconducting GaInP wires grown by MOCVD
001032 (2002) DC-92 GHz ultra-broadband high gain InP HEMT amplifier with 410 GHz gain-bandwidth product
001050 (2002) A high gain-bandwidth product InP HEMT distributed amplifier with 92 GHz cut-off frequency for 40 Gbit/s applications and beyond
001224 (2001) Inductively coupled plasma -- plasma enhanced chemical vapor deposition silicon nitride for passivation of InP based high electron mobility transistors (HEMTs)
001411 (2000) Output conductance dispersion and drain current transients in InP-HFETs: Observations and equivalent circuit model
001634 (1999) Triple channel HEMT on InP (Camel HEMT) for large-signal high-speed applications
001969 (1998) New aspects and mechanism of kink effect in InAlAs/InGaAs/InP inverted HFET's
001A19 (1998) Doping optimizations for InGaAs/InP composite channel HEMTs
001B67 (1997) HEMT à canal composite GaInAs/InP pour circuits de modulation optique
001B83 (1997) Uniform InAlAs/InP HFET fabricated using selective dry recess etching
001B86 (1997) UV-deposited silicon nitride coupled with XeF2 surface cleaning for III-V optoelectronic device passivation
001C93 (1997) Controlled steam oxidation of AlInAs for microelectronics and optoelectronics applications
001E49 (1996) Les transistors à effet de champ à hétérostructure sur InP
001F10 (1996) Low excess noise of InAlAs/InP HFETs fabricated using selective dry recess etching
002045 (1995-06-15) Acoustical and optical properties of Ga0.52In0.48P: A Brillouin scattering study
002370 (1994) Optical characterization of chemical beam epitaxy grown Ga0.52In0.48P layers and related microstructures
002526 (1993) UVCVD dielectric films for InP-based optoelectronic devices
002823 (1992) Passivation of InP using In(PO3)3-condensed phosphates : from oxide growth properties to metal-insulator-semiconductor field-effect-transistor devices
002A78 (1990) Silice UVCVD pour transistors MISFET autoalignés sur InP

List of associated KwdEn.i

Nombre de
documents
Descripteur
7Indium Phosphides
5Experimental study
5Field effect transistor
5III-V compound
5Microelectronic fabrication
5Semiconducting indium phosphide
4Binary compound
4High electron mobility transistor
4Ternary compound
3Ellipsometry
3Experiments
3Field effect transistors
3Gallium phosphides
3Heterojunction transistor
3Indium Arsenides
3Indium phosphide
3Indium phosphides
3Passivation
3Scanning electron microscopy
3Theory
2Brillouin effect
2Chemical vapor deposition
2Electric breakdown
2Epitaxial layers
2Gallium Arsenides
2Heterojunctions
2High electron mobility transistors
2Integrated circuit
2Ionization of solids
2MIS structure
2Optoelectronic device
2Reactive ion etching
2Refractive index
2Semiconductor device manufacture
2Semiconductor materials
2Silicon Nitrides
2Ternary compounds
2Thin film
2Transmission electron microscopy
1Absorption
1Acoustic properties
1Aluminium Arsenides
1Aluminium arsenides
1Annealing
1Application
1Avalanche diode
1Bandwidth
1Breakdown voltage
1Broadband amplifiers
1CVD
1Carrier mobility
1Characterization
1Circuit design
1Cleaning
1Composite canal
1Composite material
1Computer simulation
1Coplanar line
1Crystal growth from vapors
1Crystalline structure
1Cut off frequency
1Cutoff frequency
1Data communication systems
1Delta doping
1Density of states
1Deposition
1Dielectric function
1Dielectric materials
1Diode
1Distributed amplifier
1Distributed amplifiers
1Drain noise spectral density
1Drain resistance
1Driver
1Dry etching
1Dry recess etching
1Dynamic characteristic
1Elastic constants
1Electric breakdown of solids
1Electric current measurement
1Electric currents
1Electric resistance
1Electroabsorption modulator
1Electron transport properties
1Electronic properties
1Engraving
1Epitaxy
1Equivalent circuits
1Eye diagram
1Frequencies
1Gain
1Gates (transistor)
1Hall mobility
1Heterojunction
1High breakdown voltage transistors
1High voltage
1Hole traps
1III-V semiconductors
1Impact ionization
1Impedance

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