Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « F. Pascal »
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F. Pardo < F. Pascal < F. Pascal Delannoy  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 8.
Ident.Authors (with country if any)Title
000C48 (2003-04-01) Analysis of 1/f noise current sources in InP/InGaAs heterojunction bipolar transistors
001120 (2001-02-15) Low Frequency Noise of InP/InGaAs Heterojunction Bipolar Transistors
001831 (1998-09-01) Influence of geometry and passivation on noise in GaInP/GaAs heterojunction bipolar transistors
001989 (1998) Influence of a base epitaxial regrowth on first order and low frequency noise measurements on GaInP/GaAs HBTs
001C96 (1997) Comparison of noise between passivated and unpassivated AlGaAs/GaAs and GaInP/GaAs HBTs
001E92 (1996) Photodetection at 3.65 μm in the atmospheric window using InAs0.91Sb0.09/GaAs heteroepitaxy
002A18 (1991) Improvement of the crystalline, optical and electrical quality of MOVPE GaInSb layers
002D94 (1988) Growth of GaInAsSb alloys by MOCVD and characterization of GaInAsSb/GaSb p-n photodiodes

List of associated KwdEn.i

Nombre de
documents
Descripteur
7Experimental study
51/f noise
5Heterojunction bipolar transistors
3Binary compound
3Epitaxy
3Gallium Arsenides
3Gallium arsenides
3III-V compound
3III-V semiconductors
3Indium compounds
3Semiconductor device noise
3Ternary compound
2Aluminum Arsenides
2Characterization
2Chemical vapor deposition
2Crystal growth
2Gallium Indium Antimonides Mixed
2Gallium Phosphides
2Indium Phosphides
2Inorganic compound
2Organometallic compound
2Passivation
2Theoretical study
2Thin film
1Buffer layer
1Chemical composition
1Comparative study
1Electrical characteristic
1Electron-hole recombination
1Energy band
1Gallium Indium Antimonides arsenides Mixed
1Gallium compounds
1Generation recombination noise
1Growth from vapor
1Heteroepitaxy
1Heterojunction
1Indium Antimonides
1Morphology
1Optical microscopy
1Phosphorus compounds
1Photodetector
1Photodiode
1Production process
1Regrowth
1Semiconductor device models
1Semiconductor materials
1Solid solution
1Support
1Transistor base
1X ray diffraction

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