Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « F. Omnes »
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List of bibliographic references

Number of relevant bibliographic references: 32.
[0-20] [0 - 20][0 - 32][20-31][20-40]
Ident.Authors (with country if any)Title
000390 (2009) Study of the passivation mechanisms of boron doped diamond using the Amplitude Modulated Step Scan Fourier Transform Photocurrent Spectroscopy
000481 (2008) n-type phosphorus-doped polycrystalline diamond on silicon substrates
001176 (2001) Photoluminescence and absorption spectroscopy of silicon-doped InGaN layers
001522 (1999-10-25) Indium incorporation above 800°C during metalorganic vapor phase epitaxy of InGaN
002952 (1991) Etude du dopage de type n et p des matériaux GaAs et GaInP
002993 (1991) Optical investigations of GaAs-GaInP quantum wells and superlattices grown by metalorganic chemical vapor deposition
002A28 (1991) GaAs-GaInP multilayers for high performance electronic devices
002A29 (1991) Ga0.51In0.49P/GaxIn1-xAs lattice-matched (x=1) and strained (x=0.85) two-dimensional electron gas field-effect transistors
002A56 (1991) Defects in organometallic vapor-phase epitaxy-grown GaInP layers
002A72 (1991) A review of the band offsets measurements in the GaAs/Ga0.49In0.51P system
002B01 (1990) The first fabrication of n- and p-type Ga0.49In0.51P/Ga(In)As lattice matched and strained HIGFET structures grown by MOCVD
002B34 (1990) Magnetotransport measurements in GaInP/GaAs heterostructures
002B42 (1990) Interdiffusion of InGaAs/InP quantum wells by germanium ion implantation
002B48 (1990) In situ investigation of the low-pressure metalorganic chemical vapor deposition of lattice-mismatched semiconductors using reflectance anisotropy measuremets
002B49 (1990) In situ investigation of InAs metalorganic chemical vapor deposition growth using reflectance anisotropy
002B55 (1990) High performance GaAs/GaInP heterostructure bipolar transistors grown by low-pressure meta========???010???.horbar;organic chemical vapour deposition
002C11 (1989) Première observation d'une résistance différentielle négative dans un système à double barrière InP/Ga0,47In0,53As
002C19 (1989) Croissance et caractérisation d'hétérostructures GaAs/Ga0,49In0,51P élaborées par LP-MOCVD
002C20 (1989) Croissance et caractérisation d'alliages GaInAsP de gaps égaux à 1,3 et 1,15 μm élaborés par LP-MOCVD
002C21 (1989) Couches d'InP de très haute pureté obtenues par croissance en phase vapeur par la méthode des organométalliques
002C76 (1989) Extremely high electron mobility in a GaAs-GaxIn1-xP heterostructure grown by metalorganic chemical vapor deposition

List of associated KwdEn.i

Nombre de
documents
Descripteur
16Chemical vapor deposition
15Semiconductor materials
14Experimental study
13Gallium Arsenides
13Indium Phosphides
11Heterojunction
11Inorganic compound
8Gallium Indium Phosphides Mixed
7Gallium Indium Arsenides Mixed
7Gallium Indium Arsenides phosphides Mixed
6Crystal growth
6Organometallic compound
6Photoluminescence
5Epitaxy
5Thin film
4Low pressure
4Quantum well
4Silicon
4Superlattice
3Characterization
3Charge carrier concentration
3Doped materials
3Electron gas
3Low temperature
3Magnetoconductivity
3Microelectronic fabrication
3Optical properties
3Photoconductivity
3Two dimensional model
2Anisotropy
2Cyclotron resonance
2Deep level transient spectrometry
2Doping
2Double heterojunction
2Electrical properties
2Exciton
2Field effect transistor
2Hall effect
2High electron mobility transistor
2Indium Arsenides
2Indium additions
2Manufacturing
2Measurement
2Optoelectronic device
2Reflectance
2Secondary ion mass spectrometry
2Semiconductor laser
2Shubnikov de Haas effect
2Solid solution
2Temperature
2Thickness
2Thin films
2Voltage capacity curve
2Voltage threshold
2X ray diffraction
1Absorption spectra
1Advanced technology
1Application
1Band structure
1Boron
1Boron additions
1Bound exciton
1Buffer layer
1Buried layer
1CW laser
1Carrier density
1Cathodoluminescence
1Charge carrier mobility
1Charge carrier trapping
1Chemical composition
1Conduction electron
1Defect level
1Deposition
1Depth profiles
1Diamonds
1Diffusion
1Diode
1Discontinuity
1Distribution
1Electrical conductivity
1Electron paramagnetic resonance
1Electronic component
1Energy band
1Excitation spectrum
1Excitonic process
1Fourier transform spectroscopy
1Free carrier
1G factor
1Gallium Arsenides phosphides
1Gallium Indium Arsenides Phosphides
1Gallium Indium Arsenides phosphides
1Gallium Indium Phosphides
1Gallium Indium Phosphorus Mixed
1Gallium Phosphides
1Gallium compounds
1Gallium nitrides
1Gallium phosphide
1Gas mixtures
1Gases
1Germanium

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