Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « F. Mollot »
Attention, ce site est en cours de développement !
Attention, site généré par des moyens informatiques à partir de corpus bruts.
Les informations ne sont donc pas validées.
F. Miomandre < F. Mollot < F. Monteverde  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 50.
[0-20] [0 - 20][0 - 50][20-40]
Ident.Authors (with country if any)Title
000666 (2007) MBE growth of heavily carbon doped GaAsSb on InP for heterojunction bipolar transistor applications
000827 (2006) Free-carrier absorption and growth temperature of highly Be-doped InGaAs in molecular beam epitaxy
000955 (2005) High In content pseudomorphic InGaAs layers for high-mobility heterostructures on InP (001)
000A09 (2005) Comparison between carried-induced optical index, Ioss variations and carrier lifetime in GaInAsP/InP heterostructures for 1.55 μm DOS application
000A13 (2005) CBr4 and be heavily doped InGaAs grown in a production MBE system
000A14 (2005) As-P interface-sensitive GaInP/GaAs structures grown in a production MBE system
000A58 (2004) Two-photon absorption in InP substrates in the 1.55 μm range
000B74 (2004) Characterization of As-P interface-sensitive GaInP/GaAs structures grown in a production MBE system
000C65 (2003-01-01) Conduction band offset in the AlxGayIn1-x-yP/Ga0.52In0.48P system as studied by luminescence spectroscopy
000E42 (2002-08-05) Why do (2×4) GaAs and InAs (001) surfaces exposed to phosphorus have so different behavior? Elastic strain arguments
000E58 (2002-06-03) Electron lifetime of heavily Be-doped In0.53Ga0.47As as a function of growth temperature and doping density
000E73 (2002-03-15) Experimental study of hot-electron inelastic scattering rate in p-type InGaAs
001031 (2002) DOS optical switch for microwave optical links based applications
001101 (2001-05-07) Relationship between surface reconstruction and morphology of strained Ga1-xInxP layers grown on GaP (001) by gas-source molecular-beam epitaxy
001138 (2001) Thermally detected optical absorption, reflectance and photo-reflectance of In(As, P)/InP quantum wells grown by gas source molecular beam epitaxy
001240 (2001) Growth of strained Ga1-xInxP layers on GaP (001) by gas source molecular beam epitaxy: similarities and differences with the growth of strained arsenides
001310 (2000-10-15) Thermally detected optical absorption, reflectance, and photoreflectance of In(As,P)/InP quantum wells grown by gas source molecular beam epitaxy
001330 (2000-07-10) Interplay between segregation, roughness, and local strains in the growth of Ga0.75In0.25P alloy
001339 (2000-04-10) Composition effect on the growth mode, strain relaxation, and critical thickness of tensile Ga1-xInxP layers
001384 (2000) Strained layer growth of Ga1-xInxP on GaAs (100) and GaP (100) substrates
001425 (2000) Low frequency noise behaviour of InP/InGaAs heterojunction bipolar waveguide phototransistors

List of associated KwdEn.i

Nombre de
documents
Descripteur
31Experimental study
24III-V semiconductors
18Gallium arsenides
16Indium compounds
15Molecular beam epitaxy
12Photoluminescence
11Indium phosphides
10Ternary compounds
8GSMBE method
8Indium arsenides
8Semiconductor growth
7Crystal growth from vapors
7Experiments
7Gallium compounds
7Gallium phosphides
7Heterojunctions
7Interface structure
7Theory
6III-V compound
6Semiconducting indium phosphide
6Semiconductor epitaxial layers
6Semiconductor quantum wells
5Aluminium compounds
5Binary compounds
5Chemical beam epitaxy
5Heterostructures
5RHEED
5Semiconducting aluminum compounds
5Varactors
4Capacitance
4Doping
4Heterojunction bipolar transistors
4Heterostructure barrier varactors
4High electron mobility transistor
4Quantum wells
4Semiconducting indium gallium arsenide
4Semiconductor materials
4Strained layer
4Ternary compound
4Thin films
3Atomic force microscopy
3Binary compound
3Chemical composition
3Current density
3Electroluminescence
3Gallium Arsenides
3Hall mobility
3Indium Arsenides
3Indium Phosphides
3Microwave circuit
3Semiconducting gallium arsenide
3Semiconductor device manufacture
3Semiconductor device structures
3Semiconductor doping
3Semiconductor heterojunctions
3Theoretical study
3X-ray photoelectron spectra
2Aluminium arsenides
2Band offset
2Bipolar transistors
2Buffer layer
2Capacitance measurement
2Carbon additions
2Carrier concentration
2Carrier lifetime
2Carrier mobility
2Current voltage characteristics
2Diffusion
2Electric breakdown
2Energy-level transitions
2Etching
2Excitons
2Gallium phosphide
2Growth mechanism
2High electron mobility transistors
2Hole density
2Indium phosphide
2Integrated circuit
2Leakage currents
2Ohmic contacts
2Optical waveguides
2Optimization
2Performance evaluation
2Photoelectron spectroscopy
2Photoreflectance
2Phototransistors
2Power gain
2Schroedinger equation
2Segregation
2Semiconducting gallium compounds
2Semiconducting indium compounds
2Solid solutions
2Solid source molecular beam epitaxy
2Solid-solid interfaces
2Spurious signal noise
2Surface reconstruction
2Surface segregation
2Temperature dependence
2Thickness
2X radiation

Pour manipuler ce document sous Unix (Dilib)

EXPLOR_STEP=IndiumV3/Data/France/Analysis
HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i -k "F. Mollot" 
HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i  \
                -Sk "F. Mollot" \
         | HfdSelect -Kh $EXPLOR_AREA/Data/France/Analysis/biblio.hfd 

Pour mettre un lien sur cette page dans le réseau Wicri

{{Explor lien
   |wiki=   *** parameter Area/wikiCode missing *** 
   |area=    IndiumV3
   |flux=    France
   |étape=   Analysis
   |type=    indexItem
   |index=    Author.i
   |clé=    F. Mollot
}}

Wicri

This area was generated with Dilib version V0.5.77.
Data generation: Mon Jun 9 10:27:54 2014. Site generation: Thu Mar 7 16:19:59 2024