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Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « F. Ducroquet »
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F. Dubois < F. Ducroquet < F. Dujardin  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 8.
Ident.Authors (with country if any)Title
001C90 (1997) Deep trap characterisation and conduction band offset determination of Al0.48In0.52As/(Ga0.7Al0.3)0.48In0.52As heterostructures
002426 (1994) Deep-level characterization of AlxIn1-xAs layers grown by low pressure metal-organic chemical vapor deposition
002695 (1993) Electrical characterization of lattice-mismatched InP/InxGa1-xAs/InP heterostructures and PIN photodiodes grown by LP-MOCVD
002824 (1992) Passivation induced deep levels in GaInAs PIN planar photodiodes
002907 (1992) Electrical behavior of Yb ion in p- and n-type InP
002A75 (1990) Contribution à la mise en place d'un outil de caractérisation précoce de couches contraintes INP-INGAAS-INP pour la réalisation de photo détecteur haute performance
002B52 (1990) Identification of the Fe acceptor llevel in Ga0.47In0.53As
002C12 (1989) Mécanismes de dérive du courant d'obscurité sur des photodiodes GaInAs/InP planar passivées par SiNx

List of associated KwdEn.i

Nombre de
documents		Descripteur
5Experimental study
5Semiconductor materials
4Gallium Indium Arsenides Mixed
3Activation energy
3Charge carrier trapping
3Deep level
3Indium Phosphides
3Indium arsenides
3Inorganic compound
3Photodiode
3Ternary compounds
2Aluminium arsenides
2DLTS
2Deep level transient spectrometry
2Electrical conductivity
2Gallium arsenides
2Heterostructures
2III-V compound
2Photoluminescence
2Temperature
1Acceptor center
1Admittance
1Band offset
1Band structure
1Binary compounds
1CVD
1Characterization
1Chemical vapor deposition
1Codoping
1Conduction bands
1Contamination
1Crystal field splitting
1Dark current
1Defect detection
1Defect level
1Defect states
1Degradation
1Heterojunction
1Impurity
1Impurity effect
1Impurity level
1Indium phosphides
1Infrared detectors
1Ionization
1Iron
1Low temperature
1Magnesium
1Manufacturing processes
1Mismatch lattice
1N type conductivity
1Optical properties
1Optical transition
1Organometallic compounds
1P type conductivity
1Passivation
1Photodetectors
1Photodiodes
1Plasma deposition
1Quaternary compounds
1Radiation detectors
1SIMS
1Schottky barrier diodes
1Secondary ion mass spectrometry
1Silicon Nitrides
1Spatial resolution
1Thickness
1Thin films
1Transport processes
1Traps
1Ytterbium
1Zero phonon process
1p i n diode

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HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i  \
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