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Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « F. Boscherini »
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F. Borson-Chazot < F. Boscherini < F. Boubal  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 10.
Ident.Authors (with country if any)Title
000B26 (2004) Local structure in dilute nitrides probed by x-ray absorption spectroscopy
000C12 (2003-10-15) Quantitative determination of short-range ordering in InxGa1-xAs1-yNy
000C24 (2003-08-15) Lattice relaxation by atomic hydrogen irradiation of III-N-V semiconductor alloys
000F32 (2002) Real examples of surface reconstructions determined by direct methods
001001 (2002) Implant and characterization of highly concentrated Fe deep centers in InP
001819 (1998-10-15) Local atomic structure in strained interfaces of InxGa1-xAs/InP heterostructures
001859 (1998-06-15) Bond-length variation in InxGa1-xAs/InP strained epitaxial layers
001887 (1998-02-15) Application of x-ray direct methods to surface reconstructions: The solution of projected superstructures
001892 (1998-01-15) Structural and optical investigation of InAsxP1-x/InP strained superlattices
001C05 (1997) Standing waves investigation of InAsP/InP superlattices

List of associated KwdEn.i

Nombre de
documents		Descripteur
9Experimental study
7Gallium arsenides
7III-V semiconductors
6Indium compounds
4Semiconductor materials
4XRD
3Annealing
3EXAFS
3Indium arsenides
3X-ray absorption spectra
2Bond lengths
2Energy gap
2Indium phosphides
2Internal stresses
2Optical constants
2Photoluminescence
2Semiconductor epitaxial layers
2Semiconductor heterojunctions
2Surface reconstruction
1Ab initio calculations
1Adsorption
1Atom probe
1Atomic structure
1Automation
1Binary compounds
1Carbon molecules
1Chemical beam epitaxy
1Deep level
1Defect states
1Density functional method
1Dilute systems
1Direct method
1Fine structure
1Fluorescence
1Fullerenes
1Gallium nitrides
1Germanium
1Gold
1Hydrogen
1IV characteristic
1Impurities
1Impurity density
1Indium nitrides
1Infrared spectra
1Interface structure
1Ion implantation
1Iron additions
1Local structure
1Ordering
1Photo-induced transient spectroscopy
1Pseudomorphic growth
1Quaternary compounds
1Semiconductor growth
1Semiconductor superlattices
1Short-range order
1Solubility limit
1Spectral line shift
1Standing waves
1Stress relaxation
1Structure
1Substitutional impurities
1Superlattices
1Surface structure
1Synchrotron radiation
1TEM
1Ternary compounds
1Theoretical study
1VPE
1Vibrational states
1XANES

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EXPLOR_STEP=IndiumV3/Data/France/Analysis

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HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i  \
                -Sk "F. Boscherini" \
         | HfdSelect -Kh $EXPLOR_AREA/Data/France/Analysis/biblio.hfd

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