IndiumV3, France, Analysis, indexItem, Author.i, E. Le Bourhis

E. Laureto < E. Le Bourhis < E. Le Gall

Facettes :

List of bibliographic references

Number of relevant bibliographic references: 17.

Ident.	Authors (with country if any)	Title
000537 (2008)		Nanoindentation response of a thin InP membrane
000946 (2005)		Indentation deformation of thin {111} GaAs and InSb foils : influence of polarity
000A06 (2005)		Conservative indentation flow throughout thin (011) InP foils
000A81 (2004)		Solid-solution strengthening in ordered InxGa1-xP alloys
000B37 (2004)		Indentation punching through thin (011) InP
000D11 (2003)		Plastic deformation of III-V semiconductors under concentrated load
000F20 (2002)		Strength enhancement of compensated strained InP/AlP superlattice
000F85 (2002)		Low-load deformation of InP under contact loading; comparison with GaAs
001133 (2001)		Twist-bonded compliant substrates for III-V semiconductors heteroepitaxy
001194 (2001)		Non-linear solid solution strengthening of InGaAs alloy
001233 (2001)		In-depth deformation of InP under a Vickers indentor
001395 (2000)		Room-temperature plasticity of InAs
001436 (2000)		In-depth structure of rosette arms in indium phosphide
001468 (2000)		Deformations induced by a Vickers indentor in InP at room temperature
001C39 (1997)		Material flow at the surface of indented indium phosphide
001F05 (1996)		Material flow under an indentor in indium phosphide
002162 (1995)		Investigation of the plasticity of InP as a function of temperature

List of associated KwdEn.i

Nombre de documents	Descripteur
12	Semiconductor materials
11	Experimental study
11	Indentation
11	Indium phosphides
7	Plasticity
6	Binary compounds
6	Dislocations
6	Gallium arsenides
5	TEM
4	Indium arsenides
4	Monocrystals
4	Nanoindentation
4	Plastic deformation
4	Plastic flow
4	Ternary compounds
4	Transmission electron microscopy
3	III-V semiconductors
3	Optical microscopy
3	SEM
2	Cathodoluminescence
2	Hardness
2	Material flow
2	Mechanical strength
2	Phosphides
2	Plasticity zone
2	Strengthening
2	Surfaces
2	Temperature dependence
2	Thin films
2	Vickers hardness
2	Vickers test
1	Aluminium arsenides
1	Aluminium phosphides
1	Ambient temperature
1	Applied load
1	Atomic force microscopy
1	Chemical beam epitaxy
1	Compensation
1	Compression test
1	Convergent beam method
1	Cracking
1	Critical resolved shear stress
1	Deformation
1	Delamination
1	Dislocation density
1	Dislocation motion
1	Electron diffraction
1	Etching
1	Flow stress
1	Focused ion beam technology
1	Fractures
1	Gallium phosphides
1	Growth mechanism
1	Hardening
1	Hardness indentation
1	Heteroepitaxy
1	Heterostructures
1	High temperature
1	II-V semiconductors
1	Indium antimonides
1	Indium phosphide
1	Inorganic compounds
1	Interferometry
1	Light interferometry
1	MOVPE method
1	Mechanical properties
1	Mechanical tests
1	Microhardness
1	Microstructure
1	Mismatch lattice
1	Molecular beam epitaxy
1	Non linear effect
1	Penetration depth
1	Photolithography
1	Polarity
1	Profilometry
1	Quantitative chemical analysis
1	Relaxation
1	Ruptures
1	Scanning electron microscopy
1	Shear
1	Slip
1	Slip flow
1	Solid solution hardening
1	Solid-solid interfaces
1	Stiffness
1	Strains
1	Stress effects
1	Stress relaxation
1	Substructure
1	Superlattices
1	Topography
1	Twinning
1	Yield strength
1	Yield stress

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   |flux=    France
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   |clé=    E. Le Bourhis
}}

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Serveur d'exploration sur l'Indium - Analysis (France)Index « Auteurs » - entrée « E. Le Bourhis »

List of bibliographic references

List of associated KwdEn.i

Pour manipuler ce document sous Unix (Dilib)

Pour mettre un lien sur cette page dans le réseau Wicri

Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « E. Le Bourhis »