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Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « E. Chartier »
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E. Canovas < E. Chartier < E. Chassaing  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 8.
Ident.Authors (with country if any)Title
001236 (2001) Hydrogen-related effects in GaInP/GaAs HBTs: incorporation, removal and influence on device reliability
001727 (1999) High-performance collector-up InGaP/GaAs heterojunction bipolar transistor with Schottky contact
001C97 (1997) Collector-up InGaP/GaAs-double heterojunction bipolar transistors with high fmax
002335 (1994) Le transistor bipolaire à hétérojonction GaInP/GaAs. Technologie et performances hyperfréquences
002391 (1994) LP-MOCVD grown GaInP/GaAs HBTs for VCOs and power amplifier MMICs
002405 (1994) GaInP-GaAs heterojunction bipolar transistors grown by low pressure metalorganic chemical vapour deposiion for voltage-controlled oscilators and power amplifier microwave monolithic integrated circuits
002851 (1992) Low frequency noise in selfaligned GaInP/GaAs heterojunction bipolar transistor
002A30 (1991) First microwave characterization of LP-MOCVD grown GaInP/GaAs self-aligned HBT

List of associated KwdEn.i

Nombre de
documents		Descripteur
5Heterojunction transistor
4Gallium Arsenides
3Binary compound
3Heterojunction bipolar transistors
3Ternary compound
2Characterization
2Electric breakdown of solids
2Experimental study
2Gallium Indium Phosphides Mixed
2Gallium arsenides
2Gallium phosphide
2III-V compound
2Indium phosphide
2Microelectronic fabrication
2Microwave transistor
2Semiconducting gallium arsenide
2Semiconductor device
2Transistor
2X ray diffraction
11/f noise
1Annealing
1Bipolar transistor
1Boron
1Boron implantation
1Carbon addition
1Charge carrier recombination
1Charge carriers
1Chemical vapor deposition
1Current gain
1Degradation
1Doping
1Electron injection
1Epitaxial film
1Epitaxy
1Equivalent circuit
1Experiments
1Frequency response
1Gallium Indium Phosphorus Mixed
1Gallium Phosphides
1Heterojunction
1Heterojunctions
1Hydrogenation
1Indium Phosphides
1Ion implantation
1Leakage current
1Low pressure
1Manufacturing process
1Microelectronics
1Microwave device
1Microwave oscillator
1Monolithic integrated circuit
1Noise spectrum
1Organometallic compound
1Performance
1Performance characteristic
1Power amplifier
1Power gain
1Power transistor
1Reliability
1Reviews
1SIMS
1Schottky contact
1Secondary ion mass spectrometry
1Semiconducting boron
1Semiconducting indium compounds
1Semiconducting indium phosphide
1Semiconductor device manufacture
1Semiconductor doping
1Theoretical study
1Thin film
1Thin film device
1Transistor base
1Transmission electron microscopy
1Voltage capacity curve
1Voltage controlled oscillator

Pour manipuler ce document sous Unix (Dilib)

EXPLOR_STEP=IndiumV3/Data/France/Analysis

HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i -k "E. Chartier" 

HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i  \
                -Sk "E. Chartier" \
         | HfdSelect -Kh $EXPLOR_AREA/Data/France/Analysis/biblio.hfd

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   |clé=    E. Chartier
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