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Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « D. Mencaraglia »
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D. Meichenin < D. Mencaraglia < D. Metz  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 9.
Ident.Authors (with country if any)Title
000203 (2011) Investigation of the metastability behavior of CIGS based solar cells with ZnMgO-Zn (S,O,OH) window-buffer layers
000209 (2011) Influence of Ga content on defects in CuInxGa1-xSe2 based solar cell absorbers investigated by sub gap modulated photocurrent and admittance spectroscopy
000331 (2010) Electrical characterization of CIGSe solar cells metastability with Zn(S,O,OH)-ZnMgO interface buffer layers
000861 (2006) Admittance spectroscopy of cadmium free GIGS solar cells heterointerfaces
000B58 (2004) Electrical characterization of ITO/CuPc/Al diodes using temperature dependent capacitance spectroscopy and I-V measurements
000C90 (2003) Studies of buried interfaces Cu(In, Ga)Se2/CdS XPS and electrical investigations
000D94 (2003) Characterization of ITO/CuPc/AI and ITO/ZnPc/Al structures using optical and capacitance spectroscopy
000E07 (2003) Admittance spectroscopy for non-crystalline thin film devices characterization: comparison of Cu(In, Ga)Se2 and a-Si:H cases
000E92 (2002) XPS and electrical studies of buried interfaces in Cu(In, Ga)Se2 solar cells

List of associated KwdEn.i

Nombre de
documents		Descripteur
6Copper selenides
6Gallium selenides
6Indium selenides
6Solar cell
5Experimental study
4Buffer layer
4Electronic density of states
4Voltage current curve
3Capacitance
3Defect density
3Interface
2Band structure
2Cadmium sulfide
2Electric admittance
2Frequency dependence
2Gallium
2Gallium phosphide
2Illumination
2Metallophthalocyanine
2Metastable state
2Photoelectric current
2Quaternary compound
2Semiconductor materials
2Thermal annealing
2Vapor deposition
2Zinc oxide
2Zinc sulfide
1Acceptor center
1Activation energy
1Admittance
1Aluminium
1Americium
1Amorphous hydrogenated material
1Amorphous state
1Atomic layer method
1Binary compound
1Buried layer
1Chemical bath deposition
1Chemical composition
1Chemical vapor deposition
1Coated material
1Concentration distribution
1Copper
1Copper complexes
1Copper sulfide
1Cross section
1Crystal growth from vapors
1Diode
1Dispersion
1Donor center
1Electrical conductivity
1Electrical properties
1Electronic properties
1Equivalent circuits
1Fabrication property relation
1Free carrier
1Frontier orbital
1Heterointerface
1Heterojunction
1Hysteresis
1II-VI semiconductors
1Impurity
1Indium oxide
1Indium sulfide
1Interface defect
1Interfacial layer
1Numerical simulation
1Optical properties
1Performance evaluation
1Photoconductivity
1Photoelectron spectrometry
1Photoluminescence
1Photovoltaic cell
1Photovoltaic system
1Polycrystals
1Poole Frenkel effect
1Poole-Frenkel effect
1Rectifying contact
1Sandwich structure
1Shallow level
1Silicon
1Software
1Solar cells
1Space charge
1Space charge limited conduction
1Surface photovoltage
1Temperature dependence
1Temperature effect
1Thermal properties
1Thin film
1Thin film devices
1Thin films
1Tin oxide
1Vacuum deposition
1Voltage capacity curve
1X-ray photoelectron spectra
1Zinc complexes
1Zinc hydroxide

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