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Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « C. Varenne »
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C. Vannuffel < C. Varenne < C. Vassallo  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 6.
Ident.Authors (with country if any)Title
000137 (2012) Comparison of InP Schottky diodes based on Au or Pd sensing electrodes for NO2 and O3 sensing
000477 (2009) A comparative study of Schottky barrier height enhancement by realized pseudo-Schottky diodes on p-InP
000565 (2008) Improvement in lifetime of pseudo-Schottky diode sensor : Towards selective detection of O3 in a gaseous mixture (O3, NO2)
000795 (2006) Nitridation of InP(1 0 0) substrates studied by XPS spectroscopy and electrical analysis
001011 (2002) Gas sensing properties of pseudo-Schottky diodes on p-type indium phosphide substrates - Application to O3 and NO2 monitoring in urban ambient air
001237 (2001) Highly NO2 sensitive pseudo Schottky barrier diodes on p-type InP with improved electrical characteristics

List of associated KwdEn.i

Nombre de
documents		Descripteur
3Barrier height
3Indium phosphide
2Gas sensors
2Metallizing
2Nitrogen dioxide
2Nitrogen oxides
2Ozone
2Rectifying contact
2Schottky barrier diode
2Schottky barrier diodes
2Semiconducting indium phosphide
2Theory
2X-ray photoelectron spectra
1Active layer
1Annealing
1Application
1Binary compound
1Carbon monoxide
1Carrier concentration
1Carrier density
1Catalyst activity
1Chemical bonds
1Chemical sensors
1Comparative study
1Core levels
1Coverage rate
1Electric contact
1Electrical characteristic
1Electrochemical sensors
1Experiments
1Gallium selenides
1Gas detector
1Heat treatment
1Heat treatments
1III-V semiconductors
1Indium phosphides
1Interface states
1Leakage currents
1Lifetime
1Measurement sensor
1Metal-semiconductor contacts
1Metallic bonds
1Monocrystals
1Nitridation
1Ohmic contacts
1Oxidation
1Plasma assisted processing
1Platinum phosphide
1Real time
1Sample preparation
1Schottky barrier
1Schottky barriers
1Schottky diode hydrogen sensors
1Selectivity
1Semiconductor doping
1Semiconductor materials
1Sensitivity analysis
1Stacking sequence
1Substrates
1Surface treatments
1Tactile sensor
1Temperature effects
1Thin film devices
1Thin films
1Ultrathin films

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EXPLOR_STEP=IndiumV3/Data/France/Analysis

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HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i  \
                -Sk "C. Varenne" \
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