Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « C. Seassal »
Attention, ce site est en cours de développement !
Attention, site généré par des moyens informatiques à partir de corpus bruts.
Les informations ne sont donc pas validées.
C. Schwab < C. Seassal < C. Sebenne  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 25.
[0-20] [0 - 20][0 - 25][20-24][20-40]
Ident.Authors (with country if any)Title
000008 (2013) Uniquely and arbitrarily shaped laser resonators using 2D InAsP/InP photonic crystals
000011 (2013) Towards an Integrated Mode-Locked Microlaser Based on Two-Dimensional Photonic Crystals and Graphene
000580 (2008) Electrically injected InP microdisk lasers integrated with nanophotonic SOI circuits
000851 (2006) Compact Photonic devices based on 1D and 2D photonic crystal broadband reflectors
000871 (2005) Tuning a two-dimensional photonic crystal resonance via optical carrier injection
000A71 (2004) Surface operation photonic devices based on two dimensional InP membrane photonic crystals
000C11 (2003-11) 3D structuring of multilayer suspended membranes including 2D photonic crystal structures
000C64 (2003-01-01) Two-dimensional hexagonal-shaped microcavities formed in a two-dimensional photonic crystal on an InP membrane
000C72 (2003) Very low threshold vertical emitting laser operation in InP graphite photonic crystal slab on silicon
000E13 (2002-12-30) InP-based two-dimensional photonic crystal on silicon: In-plane Bloch mode laser
000E33 (2002-09-01) Propagation losses of the fundamental mode in a single line-defect photonic crystal waveguide on an InP membrane
000E79 (2002-02-01) Near-field probing of active photonic-crystal structures
000E88 (2002) Microlasers à cristaux photoniques en InP reporté sur silicium
001228 (2001) InP microdisk lasers on silicon wafer: CW room temperature operation at 1.6μm
001229 (2001) InP 2D photonic crystal microlasers on silicon wafer: Room temperature operation at 1.55 μm
001274 (2001) Characterisation of 2D photonic crystals cavities on InP membranes
001294 (2000-12-01) InAs quantum wires in InP-based microdisks: Mode identification and continuous wave room temperature laser operation
001432 (2000) InP-based MOEMS and related topics
001639 (1999) The strength of surface micromachined indium phosphide devices evaluated by Weibull analysis of tensile and bending tests
001994 (1998) Highly selective and widely tunable 1.55-μm InP/air-gap micromachined Fabry-Perot filter for optical communications
001995 (1998) Highly selective 1.55 μm InP/air gap micromachined Fabry-Perot filter for optical communications

List of associated KwdEn.i

Nombre de
documents
Descripteur
12Experimental study
8III-V semiconductors
7Binary compounds
7Indium phosphides
7Micromachining
6Indium compounds
5Optical pumping
5Photonic crystals
4Optical waveguides
4Photoluminescence
4Photonic band gap
4Quantum well lasers
4Semiconducting indium phosphide
4Semiconductor quantum wells
4Two dimensional structure
3Experiments
3Heterojunctions
3Indium Phosphides
3Indium phosphide
3Membranes
3Molecular beam epitaxy
3Nanotechnology
3Optical communication
3Optical filters
3Optical losses
3Optical materials
3Optoelectronic devices
3Photonic crystal
3Photonics
3Semiconductor materials
3Silicon wafers
3Theory
3Wavelength division multiplexing
2Ambient temperature
2Computerized simulation
2Electromechanical device
2Electron beam lithography
2Fabry Perot filters
2Finite difference time-domain analysis
2III-V compound
2Indium Arsenides phosphides
2Integrated optics
2Laser materials
2Microlaser
2Micromechanical devices
2Microstructure
2Miniaturization
2Mirrors
2Multilayers
2Optical microcavity
2Optical resonators
2Reactive ion etching
2Semiconductor device manufacture
2Semiconductor lasers
2Semiconductor quantum wires
2Theoretical study
2photonic crystals
1Adhesion
1Band structure
1Bending strength
1Bending test
1Binary compound
1Bloch wave
1Bragg reflection
1CW lasers
1Cavity resonators
1Charge carrier injection
1Chemical etching
1Class E
1Critical point drying
1Cross section
1Crystal lattices
1Digital simulation
1Dispersion relation
1Electromechanical system
1Emission spectra
1Etching
1Experimental result
1Fabrication
1Fabry Perot resonator
1Fabry-Perot resonators
1Field distribution
1Finite difference method
1Free field
1Frequency division multiplexing
1Gradient index
1Graphene
1Graphite
1Guided wave
1High temperature operations
1Hydrophilic wafer bonding
1Infrared spectra
1Laser cavity resonators
1Laser modes
1Laser optics
1Laser tuning
1Light propagation
1Light reflection
1Magnetic fields
1Manufacturing process

Pour manipuler ce document sous Unix (Dilib)

EXPLOR_STEP=IndiumV3/Data/France/Analysis
HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i -k "C. Seassal" 
HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i  \
                -Sk "C. Seassal" \
         | HfdSelect -Kh $EXPLOR_AREA/Data/France/Analysis/biblio.hfd 

Pour mettre un lien sur cette page dans le réseau Wicri

{{Explor lien
   |wiki=   *** parameter Area/wikiCode missing *** 
   |area=    IndiumV3
   |flux=    France
   |étape=   Analysis
   |type=    indexItem
   |index=    Author.i
   |clé=    C. Seassal
}}

Wicri

This area was generated with Dilib version V0.5.77.
Data generation: Mon Jun 9 10:27:54 2014. Site generation: Thu Mar 7 16:19:59 2024