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Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « C. Robert »
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C. Ritter < C. Robert < C. Robert-Goumet  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 11.
Ident.Authors (with country if any)Title
000795 (2006) Nitridation of InP(1 0 0) substrates studied by XPS spectroscopy and electrical analysis
000B90 (2004) Adhesive properties of silicone polymers on some typical opto-electronic substrates: influence of the network density
001195 (2001) Nitridation of InP(100) surface studied by AES and eels spectroscopies
001262 (2001) Effect of InSb buffer layer in MIS structures based on InP
001462 (2000) Effect of InSb layer on the interfacial and electrical properties in the structures based on InP
001484 (2000) Angular distribution of electrons elastically reflected from polycrystalline metals (Pd, In)
001735 (1999) Experimental determination of the inelastic mean free path of electrons in GaSb and InSb
001936 (1998) Some applications of elastic peak electron spectroscopy for semiconductor surface studies
001960 (1998) Passivation of III-V compounds used for metal-insulator, InP(100) structures
001C81 (1997) Electrical characterization of alumina layers deposited by evaporation cell on Si and restructured InP substrates
001E70 (1996) Study of Al2O3 condensation on Si(100) and InP(100) substrates

List of associated KwdEn.i

Nombre de
documents		Descripteur
9Experimental study
7Indium phosphides
4Aluminium oxides
4Binary compounds
4Indium antimonides
3Buffer layer
3MIS structures
3Monte Carlo methods
3Semiconductor materials
3Surface treatments
2AES
2CV characteristic
2Crystal growth
2Digital simulation
2Elastic scattering
2Electron beam evaporation
2III-V semiconductors
2Indium phosphide
2Nitridation
2Passivation
2Silicon
1Adhesive
1Adhesive joint
1Adhesivity
1Aluminium oxide
1Angular distribution
1Argon ions
1Arsenides phosphides
1Backscattering
1Barrier height
1Binary compound
1Chemical bonds
1Chemical treatment
1Comparative study
1Core levels
1Coverage rate
1Crosslink density
1Crosslinked polymer
1Defect states
1Electrical properties
1Electron energy loss spectra
1Electron scattering
1Electron spectrometry
1Finite element method
1Gallium antimonides
1Gold
1IV characteristic
1Indium
1Indium arsenides
1Interface electron state
1Interface state
1Interface structure
1MIS structure
1Materials preparation
1Mean free path
1Metallic bonds
1Modeling
1Monocrystals
1Numerical simulation
1Palladium
1Physical radiation effects
1Plasma assisted processing
1Plasma deposition
1Property structure relationship
1Schottky barrier diodes
1Siloxane polymer
1Stacking sequence
1Substrates
1Tensile property
1Theoretical study
1Thin films
1Ultrathin films
1Voltage capacity curve
1X-ray photoelectron spectra

Pour manipuler ce document sous Unix (Dilib)

EXPLOR_STEP=IndiumV3/Data/France/Analysis

HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i -k "C. Robert" 

HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i  \
                -Sk "C. Robert" \
         | HfdSelect -Kh $EXPLOR_AREA/Data/France/Analysis/biblio.hfd

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