Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « C. Michel »
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C. Meziere < C. Michel < C. Michellon  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 7.
Ident.Authors (with country if any)Title
000D97 (2003) Cationic ordering in hexagonal perovskite derivatives: 12 R-ordered polytype oxides, Ba12Ca3Mo3Mn6O36 and Ba12In3Mn9O34.5
001931 (1998) Structural and spectroscopic study of a new indium based oxide
002A37 (1991) Experimental analysis of temperature dependence of deep-level capture cross-section properties at the Au oxidized InP interface
002D35 (1988) The effect of the plasma characteristics upon electrical properties of InP oxide obtained in an oxygen plasma
002E96 (1987) Preparation and electrical properties of thin native oxide double-layer insulator films on n-type InP
002F39 (1987) Effect of a finite R.F. conductance of native oxide on InP metal/insulator/semiconductor admittance
003014 (1986) Interface properties of MIS structures prepared by plasma oxidation of n-InP

List of associated KwdEn.i

Nombre de
documents
Descripteur
5Indium Phosphides
4Voltage capacity curve
3Experimental study
3MIS structure
3Voltage current curve
2Barium oxides
2Crystal structure
2Indium oxides
2Interface electron state
2Oxidation
2Passivation
1Calcium oxides
1Capacitor
1Charge carrier trapping
1Chemical composition
1Crystal field
1Czochralski method
1Deep level
1Deep level transient spectrometry
1Density of states
1Deposition
1Diode
1Doped materials
1Electrical characteristic
1Electrical conductivity
1Electrical insulation
1Electron microscopy
1Europium additions
1Fluorescence
1High-resolution methods
1Inorganic compound
1Ion distribution
1Ion substitution
1Lanthanum oxides
1Liquid encapsulation
1Low temperature
1MOS capacity
1Manganese oxides
1Material testing
1Microelectronic fabrication
1Molybdenum oxides
1N type conductivity
1Operating conditions
1Order disorder
1Perovskites
1Photoelectron emission
1Plasma deposition
1Processing control
1Quaternary compounds
1Semiconductor materials
1Single crystal
1Stoichiometry
1Structural models
1Surface electron state
1Surface layer
1Technology
1Temperature
1Thin film
1Trigonal lattices
1Voltage
1X ray
1XRD

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