IndiumV3, France, Analysis, indexItem, Author.i, C. Maneux

Facettes :

List of bibliographic references

Number of relevant bibliographic references: 7.

Ident.	Authors (with country if any)	Title
000179 (2011)		Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses
000204 (2011)		Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design
000258 (2010)		Thermal aging model of InP/InGaAs/InP DHBT
000277 (2010)		Preliminary results of storage accelerated aging test on InP/InGaAs DHBT
000870 (2005)		Two-dimensional DC simulation methodology for InP/GaAs0.51Sb0.49/InP heterojunction bipolar transistor
000D59 (2003)		High current effects in InP/GaAsSb/InP DHBT: Physical mechanisms and parasitic effects
002160 (1995)		LF excess noise analysis of AlGaAs/GaAs and AlGaAs/InGaAs/GaAs HEMTs

List of associated KwdEn.i

Nombre de documents	Descripteur
6	Binary compound
6	Heterojunction bipolar transistors
5	Indium phosphide
4	Base emitter junction
4	Current density
4	Damaging
4	Failures
4	Reliability
3	Accelerated aging test
3	Collector
3	Current gain
2	Circuit design
2	Compact design
2	Computer aided design
2	Direct current
2	Electric stress
2	Electrical model
2	High density
2	Modeling
2	Ternary compound
2	Very high speed integrated circuits
1	1/f noise
1	Activation energy
1	Ageing
1	Aging test
1	Aluminium Arsenides
1	Arrhenius equation
1	Base collector junction
1	Base collector junctions
1	Buffer layer
1	Carrier concentration
1	Carrier lifetime
1	Concentration effect
1	Conduction band
1	Doping
1	Electric field effects
1	Electrical characteristic
1	Electron-hole recombination
1	Energy gap
1	Frequency characteristic
1	Gallium Arsenides
1	Gallium antimonides
1	Gallium arsenides
1	High electron mobility transistor
1	High strength current
1	III-V compound
1	Ideality
1	Implementation
1	Indium Arsenides
1	Minority carrier
1	Noise spectrum
1	Numerical simulation
1	Planarization
1	Pseudomorphic transistor
1	Semiconducting gallium compounds
1	Semiconducting indium compounds
1	Temperature effect
1	Test method
1	Theoretical study
1	Theory
1	Thermal ageing
1	Thermal model
1	Thermal stress
1	Transmitter
1	Two dimensional model
1	Voltage current curve

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EXPLOR_STEP=IndiumV3/Data/France/Analysis

HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i -k "C. Maneux"

HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i  \
                -Sk "C. Maneux" \
         | HfdSelect -Kh $EXPLOR_AREA/Data/France/Analysis/biblio.hfd

Pour mettre un lien sur cette page dans le réseau Wicri

{{Explor lien
   |wiki=   *** parameter Area/wikiCode missing *** 
   |area=    IndiumV3
   |flux=    France
   |étape=   Analysis
   |type=    indexItem
   |index=    Author.i
   |clé=    C. Maneux
}}

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Serveur d'exploration sur l'Indium - Analysis (France)Index « Auteurs » - entrée « C. Maneux »

List of bibliographic references

List of associated KwdEn.i

Pour manipuler ce document sous Unix (Dilib)

Pour mettre un lien sur cette page dans le réseau Wicri

Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « C. Maneux »