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Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « C. Delamarre »
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C. Delalande < C. Delamarre < C. Delerue  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 8.
Ident.Authors (with country if any)Title
001543 (1999-08-15) High resolution electron microscope analysis of lattice distortions and In segregation in highly strained In0.35Ga0.65As coherent islands grown on GaAs (001)
001706 (1999) Local stress in highly strained coherent InGaAs islands
001A33 (1998) Atomic-scale mapping of local lattice distortions in highly strained coherent islands of InxGa1-xAs/GaAs by high-resolution electron microscopy and image processing
001D19 (1997) 2D-3D transition in highly strained GaAs/Ga1-xInxAs heterostructures by transmission electron microscopy
001F59 (1996) Dislocation introduction in the initial stages of MBE growth of highly strained In0.30Ga0.70As/GaAs structures
002044 (1995-06-19) Plastic stress relaxation in highly strained In0.30Ga0.70As/GaAs structures
002060 (1995-04) Etude par microscopie électronique en transmission de la relaxation des contraintes dans les hétérostructures GaInAs/GaAs fortement désadaptées
002653 (1993) Improvement of the growth of InxGa1-xAs on GaAs (001) using Te as surfactant

List of associated KwdEn.i

Nombre de
documents		Descripteur
8Experimental study
7Gallium arsenides
6Indium arsenides
6TEM
5Ternary compounds
4Molecular beam epitaxy
4Semiconductor materials
4Stress relaxation
4Stresses
3Binary compounds
3Crystal growth
3Dislocations
3Epitaxial layers
3Heterojunctions
3Island structure
3Roughness
3Thin films
2Coalescence
2Growth mechanism
2III-V semiconductors
2Strained layer
1Atomic layer method
1Characterization
1Chemical composition
1Crystal growth from vapors
1Crystal nucleation
1Elasticity
1Epitaxy
1Finite element method
1Fourier analysis
1Gallium Indium Arsenides Mixed
1Heteroepitaxy
1Heterostructures
1High-resolution methods
1Image processing
1Indium compounds
1Inorganic compound
1Inorganic compounds
1Lattice distortion
1Lattice image
1Lattice relaxation
1Molecular beam condensation
1Morphology
1Operating mode
1Plastic deformation
1Quantum dots
1Semiconductor epitaxial layers
1Solid solutions
1Solid-solid interfaces
1Surface segregation
1Surface structure
1Surfaces
1Surfactant
1Surfactants
1Tellurium
1Temperature effects
1Thickness
1Thin film

Pour manipuler ce document sous Unix (Dilib)

EXPLOR_STEP=IndiumV3/Data/France/Analysis

HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i -k "C. Delamarre" 

HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i  \
                -Sk "C. Delamarre" \
         | HfdSelect -Kh $EXPLOR_AREA/Data/France/Analysis/biblio.hfd

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   |clé=    C. Delamarre
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