Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « B. Akkal »
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B. Akamatsu < B. Akkal < B. Alen  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 7.
Ident.Authors (with country if any)Title
000497 (2008) Study of the hBN/InP interface by deep level transient and photoluminescence spectroscopies
000795 (2006) Nitridation of InP(1 0 0) substrates studied by XPS spectroscopy and electrical analysis
001462 (2000) Effect of InSb layer on the interfacial and electrical properties in the structures based on InP
001744 (1999) Electrical study of the Au/InSb/InP system
001746 (1999) Electrical characterization of the Au/InP(100) and Au/InSb/InP(100) structures
001763 (1999) Characterization of the M.S structure by the surface photoelectrical voltage method
001970 (1998) Modelization and characterization of Au/InSb/InP Schottky systems as a function of temperature

List of associated KwdEn.i

Nombre de
documents
Descripteur
5Gold
4Indium phosphides
3Experimental study
2Barrier height
2Binary compound
2CV characteristic
2III-V compound
2IV characteristic
2Indium Phosphides
2Indium antimonides
2Interface electron state
2Interfacial layer
2MIS structures
2Microelectronic fabrication
2Schottky barrier diode
2Schottky barrier diodes
2Surface treatments
2Thin film
1Activation energy
1Aluminium oxides
1Annealing
1Binary compounds
1Boron nitride
1Characterization
1Charge exchange
1Chemical bonds
1Chemical treatment
1Computer simulation
1Conduction bands
1Core levels
1Coverage rate
1DLTS
1Deep level
1Dember effect
1Diffusion
1Donor center
1Doping
1Electrical characteristic
1Electrical properties
1Electron beam evaporation
1Electron mobility
1Hexagonal crystals
1III-V semiconductors
1Indium Antimonides
1Indium phosphide
1Interface states
1Interface structure
1Interfaces
1Materials preparation
1Metallic bonds
1Modelling
1Monocrystals
1Network analysis
1Nitridation
1PECVD
1Photoluminescence
1Photovoltage
1Plasma assisted processing
1Schottky barriers
1Schottky effect
1Semiconductor materials
1Stacking sequence
1Steady state
1Surface analysis
1Surface barrier
1Surface states
1Surface structure
1Temperature dependence
1Thermionic electron emission
1Thin films
1Transients
1Ultrathin films
1Voltage capacity curve
1Voltage current curve
1X-ray photoelectron spectra

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