Auteurs
Analysis
France
Racine
Analysis
France
Repository
Accueil
Racine
Racine

Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « A. Rocher »
Attention, ce site est en cours de développement !
Attention, site généré par des moyens informatiques à partir de corpus bruts.
Les informations ne sont donc pas validées.
A. Rochansky < A. Rocher < A. Rockett  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 12.
Ident.Authors (with country if any)Title
000A65 (2004) TEM measurement of the misfit stress by a curvature method in semiconducting epitaxial system
000A66 (2004) TEM evaluation of strain and stress in III-V semiconductor epitaxial structures
000D90 (2003) Comparison between dilute nitrides grown on {111} and (100) GaAs substrates: N incorporation and quantum well optical properties
001928 (1998) Studies of metamorphic III-V heterostructures by digital processing of HREM images
001A04 (1998) GaAlAs/GaAs metamorphic Bragg mirror for long wavelength VCSELs
001C59 (1997) InAsP/GaInP strained multilayers grown by MOVPE on (001), (113)B and (110) InP substrates: the role of the surface characteristics
002064 (1995-03-01) Direct measurement of lateral elastic modulations in a zero-net strained GaInAsP/InP multilayer
002275 (1994-06-15) Self-induced laterally modulated GaInP/InAsP structure grown by metal-organic vapor-phase epitaxy
002283 (1994-06) Etude par microscopie électronique en transmission de structures laser (GaInAsP/InP) et de la découpe de puits quantiques (GaAs, GaAlAs) par un mécanisme de glissement de dislocations
002634 (1993) Lateral thickness modulations in alternate tensile-compressive strained GaInAsP multilayers grown by gas source molecular beam epitaxy
002635 (1993) Lateral modulations in zero-net-strained GalnAsP multilayers growtn by gas source molecular-beam epitaxy
002668 (1993) Gas source molecular beam epitaxy of alternated tensile/compressive strained GaInAsP multiple quantum wells emitting at 1.5 μm

List of associated KwdEn.i

Nombre de
documents		Descripteur
7Experimental study
6Gallium arsenides
6Indium phosphides
5Indium arsenides
5Molecular beam epitaxy
5Multilayers
5TEM
4Semiconductor materials
4Ternary compounds
4Transmission electron microscopy
3Gallium phosphides
3III-V semiconductors
3Thickness
3Thin films
2Binary compounds
2Epitaxial layers
2Epitaxy
2Experiments
2Growth from vapor
2Interface structure
2Multiple quantum well
2Photoluminescence
2Quantum wells
2Quaternary compounds
2Radius of curvature
2Semiconductor lasers
2Strains
1Aluminium arsenides
1Congress
1Crystal defects
1Crystal orientation
1Crystal structure
1Curvature
1Curvature measurement
1Digital processing
1Dilute nitrides
1Dislocation glide
1Dislocations (crystals)
1Elasticity
1Experimental result
1Gallium Arsenides phosphides
1Gallium Indium Arsenides
1Gallium Indium Arsenides phosphides Mixed
1Gallium Phosphides
1Gallium antimonides
1Growth mechanism
1Heterojunctions
1High-resolution methods
1Image processing
1Indium Arsenides
1Indium Arsenides phosphides
1Indium Phosphides
1Interfaces
1Laser diodes
1Mechanical properties
1Metamorphic Bragg mirror
1Microelectronic fabrication
1Mirrors
1Misfit dislocations
1Misfit stress
1Mismatch lattice
1Modulated materials
1Modulated structure
1Modulation
1Molecular beam condensation
1Molecular beams
1Monochromators
1Morphology
1Nitrides
1Nitrogen
1Optical properties
1Organometallic compound
1Photodiodes
1Plastic deformation
1Quantum well cutting
1Quaternary system
1Red shift
1Reflection high energy electron diffraction
1Relaxation
1Scanning electron microscopy
1Secondary ion mass spectrometry
1Segregation
1Semiconducting aluminum compounds
1Semiconducting gallium arsenide
1Semiconducting gallium compounds
1Semiconducting gallium indium nitrogen arsenide
1Semiconducting indium phosphide
1Semiconductor device structures
1Semiconductor growth
1Semiconductor quantum wells
1Semiconductor thin films
1Solid solid interface
1Strained layer
1Strained quantum well
1Stress analysis
1Stress determination
1Stress measurement
1Stress relaxation
1Stresses
1Surface analysis

Pour manipuler ce document sous Unix (Dilib)

EXPLOR_STEP=IndiumV3/Data/France/Analysis

HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i -k "A. Rocher" 

HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i  \
                -Sk "A. Rocher" \
         | HfdSelect -Kh $EXPLOR_AREA/Data/France/Analysis/biblio.hfd

Pour mettre un lien sur cette page dans le réseau Wicri

{{Explor lien
   |wiki=   *** parameter Area/wikiCode missing *** 
   |area=    IndiumV3
   |flux=    France
   |étape=   Analysis
   |type=    indexItem
   |index=    Author.i
   |clé=    A. Rocher
}}
Wicri

This area was generated with Dilib version V0.5.77.
Data generation: Mon Jun 9 10:27:54 2014. Site generation: Thu Mar 7 16:19:59 2024