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Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « A. Clei »
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A. Claverie < A. Clei < A. Conan  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 8.
Ident.Authors (with country if any)Title
001B67 (1997) HEMT à canal composite GaInAs/InP pour circuits de modulation optique
001B83 (1997) Uniform InAlAs/InP HFET fabricated using selective dry recess etching
001D84 (1996-07) Characterization of electrical damage induced by CH4/H2 reactive ion etching of molecular beam epitaxial InAlAs
001E49 (1996) Les transistors à effet de champ à hétérostructure sur InP
001F10 (1996) Low excess noise of InAlAs/InP HFETs fabricated using selective dry recess etching
001F78 (1996) A study of side gate test structures in InAlAs/InGaAs HEMTs for optoelectronic circuit applications
002218 (1995) 8 Gbit/s GaAs-on-InP 1.3 μm wavelength OEIC transmitter
002A47 (1991) Electrical and structural characterization of GaAs on InP grown by OMCVD ; application to GaAs MESFETs

List of associated KwdEn.i

Nombre de
documents		Descripteur
4Indium Phosphides
3Binary compound
3Experimental study
3Field effect transistor
3Gallium Arsenides
3Heterojunction transistor
3III-V compound
3Microelectronic fabrication
3Scanning electron microscopy
2Aluminium arsenides
2Annealing
2High electron mobility transistor
2Indium arsenides
2Indium phosphide
2Reactive ion etching
2Ternary compound
1Bandwidth
1Characterization
1Chemical vapor deposition
1Circuit design
1Crystal growth
1Current gain
1Current-optical power characteristic
1Damage
1Drain noise spectral density
1Drain resistance
1Dry etching
1Dry recess etching
1Electric resistance
1Electrical characteristic
1Electronic properties
1Engraving
1Etching
1Experiments
1Field effect transistors
1Frequency characteristic
1Gallium arsenides
1Gates (transistor)
1Heterojunction
1Hydrogen
1Impact ionization
1Indium Arsenides
1Indium phosphides
1Integrated optoelectronics
1Junction field effect transistor
1Low frequency noise
1Manufacturing process
1Metal semiconductor field effect transistor
1Methane
1Microwave circuit
1Monolithic integrated circuit
1Optical modulator
1Optical transmission
1Optoelectronic device
1Optoelectronics
1Organometallic compound
1Performance characteristic
1Semiconducting indium compounds
1Semiconducting indium phosphide
1Semiconductor device manufacture
1Signal noise measurement
1Spurious signal noise
1Temperature effect
1Transfer characteristic
1Transistor
1Transistors
1Transmitter
1Voltage current curve

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