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Semiconductor device testing < Semiconductor devices < Semiconductor diodes  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 6.
Ident.Authors (with country if any)Title
000054 (2013) Unexpected surface implanted layer in static random access memory devices observed by microwave impedance microscope
000A50 (2010) Scanning capacitance microscopy characterization on diffused p-n junctions of InGaAs/InP infrared detectors
001019 (2008) Surface modification of indium tin oxide anode with self-assembled monolayer modified Ag film for improved OLED device characteristics
001983 (2004) Mode Characteristics of Semiconductor Equilateral Triangle Microcavities With Side Length of 5-20 μm
001A50 (2004) 1310 nm AlGaInAs-InP polarization insensitive multiple quantum well optical amplifier
002751 (1994-08-01) Enhancement of electron transfer and negative differential resistance in GaAs-based real-space transfer devices by using strained InGaAs channel layers

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HfdIndexSelect -h $EXPLOR_AREA/Data/Chine/Analysis/KwdEn.i  \
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