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Serveur d'exploration sur l'Indium - Analysis (Chine)

Index « Keywords » - entrée « Residual impurity »
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Research and development < Residual impurity < Residual stress  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 4.
Ident.Authors (with country if any)Title
000082 (2013) The application of single-layer graphene modified with solution-processed TiOx and PEDOT:PSS as a transparent conductive anode in organic light-emitting diodes
000B33 (2010) Hydrogen effects on crystallinity, photoluminescence, and magnetization of indium tin oxide thin films sputter-deposited on glass substrate without heat treatment
001623 (2006) Growth and characterization of InAs layers obtained by liquid phase epitaxy from Bi solvents
002104 (2000) Gas source molecular beam epitaxy of InP-based microstructures : material growth, characterization and device applications

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HfdIndexSelect -h $EXPLOR_AREA/Data/Chine/Analysis/KwdEn.i  \
                -Sk "Residual impurity" \
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