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Serveur d'exploration sur l'Indium - Analysis (Chine)

Index « Auteurs » - entrée « XIFENG LI »
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XIFA LONG < XIFENG LI < XIFENG LU  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 5.
Ident.Authors (with country if any)Title
000065 (2013) Transparent amorphous Indium-Gallium-Zinc-Oxygen thin film transistors using solution technology at low temperature
000111 (2013) Sol-gel processed indium zinc oxide thin film and transparent thin-film transistors
001199 (2008) Dependence of electrical and optical properties on thickness of tungsten-doped indium oxide thin films
001504 (2006) Transparent conductive oxide thin films of tungsten-doped indium oxide
001708 (2005) The electrical and optical properties of molybdenum-doped indium oxide films grown at room temperature from metallic target

List of associated KwdEn.i

Nombre de
documents		Descripteur
3Carrier mobility
3Cathode sputtering
3Electrical conductivity
3Thin films
2Carrier density
2Doping
2Indium additions
2Indium oxides
2Optical properties
2Preferred orientation
2Reactive sputtering
2Sol gel process
2Thin film
1Absorption coefficients
1Absorption spectra
1Amorphous state
1Electric resistivity
1Electrical measurement
1Electrical properties
1Gallium
1Hall mobility
1Indium
1Indium Oxides
1Infrared spectra
1Layer thickness
1Light transmission
1Low temperature
1Molybdenum additions
1Oxygen
1Physical vapor deposition
1Scanning electron microscopy
1Sputter deposition
1Technology
1Ternary compound
1Transistor
1Transition element compounds
1Transmittance
1Transparent thin film
1Tungsten additions
1Tungsten oxide
1Tungsten oxides
1X-ray diffraction analysis
1XRD
1Zinc
1Zinc Oxides

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