Serveur d'exploration sur l'Indium - Analysis (Chine)

Index « Auteurs » - entrée « QING HE »
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QING FENG XU < QING HE < QING HUANG  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 5.
Ident.Authors (with country if any)Title
000403 (2012) Structural, optical and electrical properties of low-temperature deposition Cu(InxGa1-x)Se2 thin films
000C84 (2009) The influence of alloy phases in the precursors on the selenization reaction mechanisms
000D26 (2009) Structure and photovoltaic characteristics of CuInSe2 thin films prepared by pulse-reverse electrodeposition and selenization process
000D93 (2009) Novel in situ resistance measurement for the investigation of CIGS growth in a selenization process
000E97 (2009) Effects of substrate temperature on the structural and electrical properties of Cu(In,Ga)Se2 thin films

List of associated KwdEn.i

Nombre de
documents
Descripteur
3Scanning electron microscopy
3Solar cell
2Copper selenides
2Electrical measurement
2Electrical properties
2Gallium selenides
2Hall effect
2Indium selenides
2Polycrystal
2Reaction mechanism
2Temperature effect
2Thin film
2Thin films
2X ray diffraction
2X ray fluorescence
2XRD
1Absorbent material
1Annealing
1Atomic force microscopy
1Chalcopyrite
1Chalcopyrite structure
1Chemical composition
1Codeposition
1Comparative study
1Conversion rate
1Copper
1Copper Gallium Indium Selenides Mixed
1Copper Indium Gallium Selenides
1Copper Indium Selenides Mixed
1Crystallinity
1Electrical characteristic
1Electrical conductivity measurement
1Electrodeposition
1Fine grain structure
1Gas solid reaction
1Glass
1Growth from vapor
1Growth mechanism
1High efficiency
1Low temperature
1Measurement
1Open market
1Operating mode
1Optical properties
1Performance
1Phase transformations
1Photovoltaic effect
1Power markets
1Power system economics
1Precursor
1Quaternary compound
1Reflectance
1Semiconductor materials
1Smooth surface
1Soda-lime glasses
1Temperature dependence
1Thin film cell
1Transmittance
1Vapor deposition
1Vaporization
1X ray diffractometry

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