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Serveur d'exploration sur l'Indium - Analysis (Chine)

Index « Auteurs » - entrée « HAO LIN »
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HAO LI < HAO LIN < HAO SHAN  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 2.
Ident.Authors (with country if any)Title
000096 (2013) Surface roughness induced electron mobility degradation in InAs nanowires
000138 (2013) Preparation and electrochemical and photoelectrochemical properties of a covalently self-assembled monolayer film based on a bis-terpyridyl ruthenium(II) complex

List of associated KwdEn.i

Nombre de
documents		Descripteur
1Absorption band
1CVD
1Catalysts
1Charge transfer
1Coatings
1Crystallinity
1Cyclic voltammetry
1Electrical properties
1Electrochemical properties
1Electron mobility
1Electron transfer
1Electronic properties
1III-V compound
1III-V semiconductors
1Indium arsenides
1Indium tin oxide electrode
1Interfaces
1Ligand
1Monolayer
1Nanoelectronics
1Nanomaterial synthesis
1Nanostructured materials
1Nanowires
1Nickel
1Nuclear magnetic resonance
1Phonon scattering
1Photoconductivity
1Photoelectric current
1Photoelectrochemistry
1Radiation effect
1Roughness
1Ruthenium complex
1Scaling laws
1Self assembly
1Self-assembled layer
1Surface effect
1Surface morphology
1Surface scattering
1Surface states
1Temperature measurement
1Thin film
1Ultraviolet visible spectrum

Pour manipuler ce document sous Unix (Dilib)

EXPLOR_STEP=IndiumV3/Data/Chine/Analysis

HfdIndexSelect -h $EXPLOR_AREA/Data/Chine/Analysis/Author.i -k "HAO LIN" 

HfdIndexSelect -h $EXPLOR_AREA/Data/Chine/Analysis/Author.i  \
                -Sk "HAO LIN" \
         | HfdSelect -Kh $EXPLOR_AREA/Data/Chine/Analysis/biblio.hfd

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{{Explor lien
   |wiki=   *** parameter Area/wikiCode missing *** 
   |area=    IndiumV3
   |flux=    Chine
   |étape=   Analysis
   |type=    indexItem
   |index=    Author.i
   |clé=    HAO LIN
}}
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