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Serveur d'exploration sur l'Indium - Analysis (Chine)

Index « Auteurs » - entrée « HAIFENG PU »
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HAIFENG LIU < HAIFENG PU < HAIFENG YANG  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 4.
Ident.Authors (with country if any)Title
000108 (2013) Solution-processed indium gallium zinc oxide thin-film transistors with infrared irradiation annealing
000192 (2013) Investigation of oxygen plasma treatment on the device performance of solution-processed a-IGZO thin film transistors
000930 (2011) Copper doped nickel oxide transparent p-type conductive thin films deposited by pulsed plasma deposition
000954 (2011) Amorphous indium zinc oxide thin film transistors with poly-4-vinylphenol gate dielectric layers

List of associated KwdEn.i

Nombre de
documents		Descripteur
2Indium oxide
2Semiconductor materials
2Surface morphology
2Thin film transistor
1Amorphous material
1Amorphous state
1Annealing
1Copper oxide
1Double layers
1Drain current
1Electrical characteristic
1Electrical conductivity
1Electrical measurement
1Electrical properties
1Fourier-transformed infrared spectrometry
1Gallium Indium Zinc Oxides Mixed
1Heat treatment
1IV characteristic
1Infrared irradiation
1Junction diodes
1Nickel additions
1Optical properties
1Oxygen
1Plasma assisted processing
1Plasma deposition
1Rectification
1Sol-gel process
1Styrene(hydroxy) polymer
1Thin film
1Thin film transistors
1Thin films
1Transmittance
1Voltage threshold
1X ray diffraction
1XRD
1Zinc oxide

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HfdIndexSelect -h $EXPLOR_AREA/Data/Chine/Analysis/Author.i  \
                -Sk "HAIFENG PU" \
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