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Serveur d'exploration sur l'Indium - Analysis (Chine)

Index « Auteurs » - entrée « GUIFENG LI »
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GUIFEN CHEN < GUIFENG LI < GUIFU YANG  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 5.
Ident.Authors (with country if any)Title
000930 (2011) Copper doped nickel oxide transparent p-type conductive thin films deposited by pulsed plasma deposition
000954 (2011) Amorphous indium zinc oxide thin film transistors with poly-4-vinylphenol gate dielectric layers
000F56 (2009) Amorphous tungsten-doped In2O3 transparent conductive films deposited at room temperature from metallic target
000F90 (2008) Tungsten-doped In2O3 transparent conductive films with high transmittance in near-infrared region
001199 (2008) Dependence of electrical and optical properties on thickness of tungsten-doped indium oxide thin films

List of associated KwdEn.i

Nombre de
documents		Descripteur
4Electrical conductivity
4Indium oxide
3Cathode sputtering
3Optical properties
3Thin films
3Tungsten additions
2Carrier density
2Carrier mobility
2Doping
2Electrical measurement
2Electrical properties
2Near infrared radiation
2Physical vapor deposition
2Transmittance
2Tungsten oxide
1Absorption coefficients
1Absorption spectra
1Amorphous material
1Amorphous semiconductors
1Copper oxide
1Double layers
1Electric resistivity
1Electrical characteristic
1Heat treatment
1IV characteristic
1Indium additions
1Junction diodes
1Layer thickness
1Nickel additions
1Partial pressure
1Plasma deposition
1Polycrystals
1Preferred orientation
1Reactive sputtering
1Rectification
1Sputter deposition
1Sputtering
1Styrene(hydroxy) polymer
1Surface morphology
1Thin film transistor
1Tin oxide
1Transparency
1Voltage threshold
1X-ray diffraction analysis
1XRD
1Zinc oxide

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