Serveur d'exploration sur l'Indium - Analysis (Chine)

Index « Auteurs » - entrée « G. Z. Ran »
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G. Z. Li < G. Z. Ran < G. Z. Sun  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 6.
Ident.Authors (with country if any)Title
000823 (2011) Improvement of structural and luminescence properties in InGaN/GaN multiple quantum wells by symmetrical thin low temperature-GaN layers
000A52 (2010) Room temperature Er3+ 1.54 μm electroluminescence from Si-rich erbium silicate deposited by magnetron sputtering
000C51 (2010) 1.54-μm electroluminescence from Si-rich erbium silicate
001613 (2006) Hole-injection mechanisms of organic light emitting diodes with Si anodes
001652 (2006) Effects of resistivity of a p-Si chip on the light-emitting efficiency of a top-emission organic light-emitting diode with the p-Si chip as the anode
001768 (2005) Organic light-emitting diodes with n-type silicon anode

List of associated KwdEn.i

Nombre de
documents
Descripteur
3Silicon
2Anode
2Charge carrier injection
2Electroluminescence
2Hole
2Indium oxide
2Optoelectronic device
2Organic light emitting diodes
2Photoluminescence
2Thin film
1Ambient temperature
1Amorphous phase
1Annealing
1Atomic force microscopy
1Bilayers
1Carrier lifetime
1Carrier mobility
1Cathode
1Cathode sputtering
1Defect density
1Desorption
1Electrical conductivity
1Electron injection
1Energy transfer
1Erbium Silicates
1Gallium
1Gallium nitride
1Growth mechanism
1High strength current
1III-V compound
1III-V semiconductors
1IV characteristic
1Indium
1Indium nitride
1Integrated optics
1Interfaces
1Light emitting diode
1Luminescence
1MOCVD
1MOVPE method
1Microstructure
1Multiple quantum well
1Nanostructured materials
1Optical properties
1Optoelectronic devices
1Performance
1Performance evaluation
1Quantum wells
1Quantum yield
1Quinoline derivatives
1RBS
1Roughness
1Semitransparent material
1Silicates
1Silicon oxides
1Temperature dependence
1Thermionic emission
1Thin films
1Time resolution
1Time resolved spectra
1Tin
1Tin oxide
1Ultrathin films
1VPE
1Wafer
1X ray diffractometry
1XRD
1n type semiconductor

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